Experimental setup for in Situ investigation of phase changing behavior in phase-change random-access memory medium by microfocusing nanosecond-time-resolved ellipsometry

Younhwa Kim, Sang Jun Kim, Sang Youl Kim, Sung Hyuck An, Dong Seok Suh, Jin Seo Noh, Sang Mock Lee, Kijoon H.P. Kim, Woong Chul Shin, Yoonho Khang

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