Evanescent-Mode Analysis of Short-Channel Effects in MOSFETs

Jiyeong Lee, Hyungsoon Shin

Research output: Contribution to journalArticlepeer-review

22 Scopus citations

Abstract

The short channel effects (SCE) of bulk MOSFETs with super-steep retrograded channels (SSR), fully-depleted SOI, and double-gate MOSFETs have been analyzed using device simulations and a scaling-length (λ) analysis. It is found that the minimum channel length should be larger than 5λ and that the depletion thickness of the SSR should be around 30 nm in order to be applicable to 70-nm CMOS technology. A high-kappa dielectric shows a limitation in scaling due to the drain-field penetration through the dielectric unless the equivalent SiO 2 thickness is very thin. The SSR gives the smallest SCE of the three structures considered.

Original languageEnglish
Pages (from-to)50-55
Number of pages6
JournalJournal of the Korean Physical Society
Volume44
Issue number1
StatePublished - Jan 2004

Keywords

  • Characteristics length
  • Double-gate MOSFET
  • Short-channel effect

Fingerprint

Dive into the research topics of 'Evanescent-Mode Analysis of Short-Channel Effects in MOSFETs'. Together they form a unique fingerprint.

Cite this