Evaluation of radio-frequency performance of gate-all-around ge/gaas heterojunction tunneling field-effect transistor with hetero-gate-dielectric by mixed-mode simulation

Hee Bum Roh, Jae Hwa Seo, Young Jun Yoon, Jin Hyuk Bae, Eou Sik Cho, Jung Hee Lee, Seongjae Cho, In Man Kang

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

In this work, the frequency response of gate-all-around (GAA) Ge/GaAs heterojunction tunneling field-effect transistor (TFET) with hetero-gate-dielectric (HGD) and pnpn channel doping profile has been analysed by technology computer-aided design (TCAD) device-circuit mixed-mode simulations, with comparison studies among ppn, pnpn, and HGD pnpn TFET devices. By recursive tracing of voltage transfer curves (VTCs) of a common-source (CS) amplifier based on the HGD pnpn TFET, the operation point (Q-point) was obtained at VDS = 1 V, where the maximum available output swing was acquired without waveform distortion. The slope of VTC of the amplifier was 9.21 V/V (19.4 dB), which mainly resulted from the ponderable direct-current (DC) characteristics of HGD pnpn TFET. Along with the DC performances, frequency response with a small-signal voltage of 10 mV has been closely investigated in terms of voltage gain (Av), unit-gain frequency (funity), and cut-off frequency (fT). The Ge/GaAs HGD pnpn TFET demonstrated Av = 19.4 dB, funity = 10 THz, fT = 0.487 THz and fmax = 18THz.

Original languageEnglish
Pages (from-to)2070-2078
Number of pages9
JournalJournal of Electrical Engineering and Technology
Volume9
Issue number6
DOIs
StatePublished - 1 Nov 2014

Bibliographical note

Publisher Copyright:
© 2014 Korean Institute of Electrical Engineers. All rights reserved.

Keywords

  • Frequency response
  • Gate-all-around
  • Hetero-gate-dielectric
  • Heterojunction
  • Mixed-mode simulation
  • TCAD
  • Tunneling field-effect transistor

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