Evaluation of interface trap densities and quantum capacitance in carbon nanotube network thin-film transistors

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Cite this

@article{02b158e906fa4e929cfac823ce4cb565,

title = "Evaluation of interface trap densities and quantum capacitance in carbon nanotube network thin-film transistors",

author = "J. Yoon and B Choi and S Choi and J Lee and J Lee and M Jeon and Y Lee and J Han and J Lee and D.M. Kim",

year = "2016",

language = "English",

volume = "27",

pages = "295704",

journal = "Nanotechnology",

issn = "0957-4484",

publisher = "IOP Publishing Ltd.",

}