TY - JOUR
T1 - Epitaxial growth and physical properties of La1-xCaxMnO3-δ thin films on MgO(001) substrates
AU - Gu, J. Y.
AU - Kim, K. H.
AU - Noh, T. W.
AU - Lee, Jeong Soo
AU - Jeong, Young Woo
AU - Jo, W.
PY - 1996
Y1 - 1996
N2 - Perovskite La1-xCaxMnO3-δ (LCMO) thin films with a wide range of x, i.e., 0.0 ≤ x ≤ 0.6, were deposited on MgO(001) substrates using a pulsed laser deposition (PLD) technique, Epitaxial La0.7Ca0.3MnO3-δ/MgO thin films were able to be grown under a condition such as 1.5 approx. 2.1 J/cm2 of a laser fluence, 650 approx. 750°C of a substrate temperature, and 100 approx. 300 mtorr of an oxygen pressure X-ray pole figures and electron diffraction pattern showed that the LCMO films were grown epitaxially on MgO(001). Rutherford Backscattering Spectroscopy measurements investigated that the epitaxial LCMO films have compositions similar to those of targets, demonstrating the PLD is a useful technique to get films with complicated chemical compositions. Various physical properties, including resistance, R, magnetoresistance, ΔR/R(H=0) ≡ (R(H)-R(0))/R(0), and magnetization, M(T), were measured. The LCMO thin films with 0.2 ≤ × ≤ 0.5 had both semiconductor-metal and ferromagnetic ordering transitions, whose temperatures are located close to each other. These physical properties were applied in terms of the magnetic polaron model.
AB - Perovskite La1-xCaxMnO3-δ (LCMO) thin films with a wide range of x, i.e., 0.0 ≤ x ≤ 0.6, were deposited on MgO(001) substrates using a pulsed laser deposition (PLD) technique, Epitaxial La0.7Ca0.3MnO3-δ/MgO thin films were able to be grown under a condition such as 1.5 approx. 2.1 J/cm2 of a laser fluence, 650 approx. 750°C of a substrate temperature, and 100 approx. 300 mtorr of an oxygen pressure X-ray pole figures and electron diffraction pattern showed that the LCMO films were grown epitaxially on MgO(001). Rutherford Backscattering Spectroscopy measurements investigated that the epitaxial LCMO films have compositions similar to those of targets, demonstrating the PLD is a useful technique to get films with complicated chemical compositions. Various physical properties, including resistance, R, magnetoresistance, ΔR/R(H=0) ≡ (R(H)-R(0))/R(0), and magnetization, M(T), were measured. The LCMO thin films with 0.2 ≤ × ≤ 0.5 had both semiconductor-metal and ferromagnetic ordering transitions, whose temperatures are located close to each other. These physical properties were applied in terms of the magnetic polaron model.
UR - http://www.scopus.com/inward/record.url?scp=0029733622&partnerID=8YFLogxK
M3 - Conference article
AN - SCOPUS:0029733622
SN - 0272-9172
VL - 401
SP - 461
EP - 466
JO - Materials Research Society Symposium - Proceedings
JF - Materials Research Society Symposium - Proceedings
T2 - Proceedings of the 1995 MRS Fall Symposium
Y2 - 27 November 1995 through 30 November 1995
ER -