Abstract
We report on the resistance switching behavior of NiO thin films grown on Pt bottom electrodes, with top electrodes of Pt, Au and Ni. NiO/Pt films with all the top electrodes show reversible switching from high-resistance state (HRS) to low-resistance state (LRS) and vice versa during unipolar current-volt age (I - V) measurements. The resistance switching ratio of the Au/NiO/Pt structure is much smaller than those of others. The HRS I - V curve of the Au/NiO/Pt structure is linear, while those of Pt/NiO/Pt and Ni/NiO/Pt structures are nonlinear. This result manifests the role of the top electrode material in the resistance switching behavior of the NiO thin films.
| Original language | English |
|---|---|
| Pages (from-to) | S88-S91 |
| Journal | Journal of the Korean Physical Society |
| Volume | 51 |
| Issue number | SUPPL. 2 |
| State | Published - Oct 2007 |
Keywords
- Current-voltage measurement
- NiO
- Resistance switching