Electrode dependence of resistance switching in NiO thin films

D. W. Kim; D. S. Shin; S. H. Chang; B. H. Park; R. Jung; X. S. Li; D. C. Kim; C. W. Lee; S. Seo

Electrode dependence of resistance switching in NiO thin films

D. W. Kim, D. S. Shin, S. H. Chang, B. H. Park, R. Jung, X. S. Li, D. C. Kim, C. W. Lee, S. Seo

Department of Physics

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

We report on the resistance switching behavior of NiO thin films grown on Pt bottom electrodes, with top electrodes of Pt, Au and Ni. NiO/Pt films with all the top electrodes show reversible switching from high-resistance state (HRS) to low-resistance state (LRS) and vice versa during unipolar current-volt age (I - V) measurements. The resistance switching ratio of the Au/NiO/Pt structure is much smaller than those of others. The HRS I - V curve of the Au/NiO/Pt structure is linear, while those of Pt/NiO/Pt and Ni/NiO/Pt structures are nonlinear. This result manifests the role of the top electrode material in the resistance switching behavior of the NiO thin films.

Original language	English
Pages (from-to)	S88-S91
Journal	Journal of the Korean Physical Society
Volume	51
Issue number	SUPPL. 2
State	Published - Oct 2007

Keywords

Current-voltage measurement
NiO
Resistance switching

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title = "Electrode dependence of resistance switching in NiO thin films",

abstract = "We report on the resistance switching behavior of NiO thin films grown on Pt bottom electrodes, with top electrodes of Pt, Au and Ni. NiO/Pt films with all the top electrodes show reversible switching from high-resistance state (HRS) to low-resistance state (LRS) and vice versa during unipolar current-volt age (I - V) measurements. The resistance switching ratio of the Au/NiO/Pt structure is much smaller than those of others. The HRS I - V curve of the Au/NiO/Pt structure is linear, while those of Pt/NiO/Pt and Ni/NiO/Pt structures are nonlinear. This result manifests the role of the top electrode material in the resistance switching behavior of the NiO thin films.",

keywords = "Current-voltage measurement, NiO, Resistance switching",

author = "Kim, {D. W.} and Shin, {D. S.} and Chang, {S. H.} and Park, {B. H.} and R. Jung and Li, {X. S.} and Kim, {D. C.} and Lee, {C. W.} and S. Seo",

year = "2007",

month = oct,

language = "English",

volume = "51",

pages = "S88--S91",

journal = "Journal of the Korean Physical Society",

issn = "0374-4884",

publisher = "Korean Physical Society",

number = "SUPPL. 2",

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TY - JOUR

T1 - Electrode dependence of resistance switching in NiO thin films

AU - Kim, D. W.

AU - Shin, D. S.

AU - Chang, S. H.

AU - Park, B. H.

AU - Jung, R.

AU - Li, X. S.

AU - Kim, D. C.

AU - Lee, C. W.

AU - Seo, S.

PY - 2007/10

Y1 - 2007/10

N2 - We report on the resistance switching behavior of NiO thin films grown on Pt bottom electrodes, with top electrodes of Pt, Au and Ni. NiO/Pt films with all the top electrodes show reversible switching from high-resistance state (HRS) to low-resistance state (LRS) and vice versa during unipolar current-volt age (I - V) measurements. The resistance switching ratio of the Au/NiO/Pt structure is much smaller than those of others. The HRS I - V curve of the Au/NiO/Pt structure is linear, while those of Pt/NiO/Pt and Ni/NiO/Pt structures are nonlinear. This result manifests the role of the top electrode material in the resistance switching behavior of the NiO thin films.

AB - We report on the resistance switching behavior of NiO thin films grown on Pt bottom electrodes, with top electrodes of Pt, Au and Ni. NiO/Pt films with all the top electrodes show reversible switching from high-resistance state (HRS) to low-resistance state (LRS) and vice versa during unipolar current-volt age (I - V) measurements. The resistance switching ratio of the Au/NiO/Pt structure is much smaller than those of others. The HRS I - V curve of the Au/NiO/Pt structure is linear, while those of Pt/NiO/Pt and Ni/NiO/Pt structures are nonlinear. This result manifests the role of the top electrode material in the resistance switching behavior of the NiO thin films.

KW - Current-voltage measurement

KW - NiO

KW - Resistance switching

UR - http://www.scopus.com/inward/record.url?scp=36348972371&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:36348972371

SN - 0374-4884

VL - 51

SP - S88-S91

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

IS - SUPPL. 2

ER -

Electrode dependence of resistance switching in NiO thin films

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Keywords

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