Electrical observations of filamentary conductions for the resistive memory switching in NiO films

D. C. Kim, S. Seo, S. E. Ahn, D. S. Suh, M. J. Lee, B. H. Park, I. K. Yoo, I. G. Baek, H. J. Kim, E. K. Yim, J. E. Lee, S. O. Park, H. S. Kim, U. In Chung, J. T. Moon, B. I. Ryu

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