Electrical characterization of Pt Schottky contacts to a-plane n-type GaN

Hogyoung Kim, Soo Hyon Phark, Keun Man Song, Dong Wook Kim

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

We carried out the micro and nanoscale investigation of the electrical properties for Pt/a-plane n-type GaN Schottky contacts. Using the thermionic emission (TE) model, the temperature-dependent barrier height and ideality factor were estimated. A notable deviation from the theoretical value in the Richardson constant indicated the formation of inhomogeneous barrier heights. The thermionic field emission (TFE) model produced better fit to the experimental current-voltage data than the TE model, which suggested that the tunneling, probably due to the presence of a large number of surface defects, played an important role in the Pt/a-plane n-type GaN Schottky contacts. Two-dimensional current map of the Schottky junctions using conductive atomic force microscopy revealed an inhomogeneous spatial current distribution, which well confirmed the existence of the inhomogeneous barrier in the Schottky diodes.

Original languageEnglish
Title of host publicationPhysics of Semiconductors - 30th International Conference on the Physics of Semiconductors, ICPS-30
Pages923-924
Number of pages2
DOIs
StatePublished - 2011
Event30th International Conference on the Physics of Semiconductors, ICPS-30 - Seoul, Korea, Republic of
Duration: 25 Jul 201030 Jul 2010

Publication series

NameAIP Conference Proceedings
Volume1399
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference30th International Conference on the Physics of Semiconductors, ICPS-30
Country/TerritoryKorea, Republic of
CitySeoul
Period25/07/1030/07/10

Keywords

  • a-plane GaN
  • Current map
  • Inhomogeneous barrier heights
  • TFE model

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