Electric field induced instabilities at liquid/liquid interfaces

Zhiqun Lin; Tobias Kerle; Shenda M. Baker; David A. Hoagland; Erik Schärfer; Ullrich Steiner; Thomas P. Russell

doi:10.1063/1.1338125

Electric field induced instabilities at liquid/liquid interfaces

Zhiqun Lin
, Tobias Kerle
, Shenda M. Baker
, David A. Hoagland
, Erik Schärfer
, Ullrich Steiner
, Thomas P. Russell

Department of Chemistry & Nanoscience

Research output: Contribution to journal › Article › peer-review

191 Scopus citations

Abstract

Thermal fluctuations at the interface between two thin liquid films of polyisoprene and oligometric styrene was affected by an external electric fields. A characteristic growth rate enhanced the interfacial fluctuations with a well-defined wavelength. The change in surface/interfacial energy when going from the thin film to the bilayer case resulted a substantial reduction in feature size confirmed by theoretical and experimental calculations.

Original language	English
Pages (from-to)	2377-2381
Number of pages	5
Journal	Journal of Chemical Physics
Volume	114
Issue number	5
DOIs	https://doi.org/10.1063/1.1338125
State	Published - 2001

Access to Document

10.1063/1.1338125

Cite this

@article{e2b7d2960f9e4908a89344fa2b5b91b6,

title = "Electric field induced instabilities at liquid/liquid interfaces",

abstract = "Thermal fluctuations at the interface between two thin liquid films of polyisoprene and oligometric styrene was affected by an external electric fields. A characteristic growth rate enhanced the interfacial fluctuations with a well-defined wavelength. The change in surface/interfacial energy when going from the thin film to the bilayer case resulted a substantial reduction in feature size confirmed by theoretical and experimental calculations.",

author = "Zhiqun Lin and Tobias Kerle and Baker, \{Shenda M.\} and Hoagland, \{David A.\} and Erik Sch{\"a}rfer and Ullrich Steiner and Russell, \{Thomas P.\}",

year = "2001",

doi = "10.1063/1.1338125",

language = "English",

volume = "114",

pages = "2377--2381",

journal = "Journal of Chemical Physics",

issn = "0021-9606",

publisher = "American Institute of Physics",

number = "5",

}

TY - JOUR

T1 - Electric field induced instabilities at liquid/liquid interfaces

AU - Lin, Zhiqun

AU - Kerle, Tobias

AU - Baker, Shenda M.

AU - Hoagland, David A.

AU - Schärfer, Erik

AU - Steiner, Ullrich

AU - Russell, Thomas P.

PY - 2001

Y1 - 2001

N2 - Thermal fluctuations at the interface between two thin liquid films of polyisoprene and oligometric styrene was affected by an external electric fields. A characteristic growth rate enhanced the interfacial fluctuations with a well-defined wavelength. The change in surface/interfacial energy when going from the thin film to the bilayer case resulted a substantial reduction in feature size confirmed by theoretical and experimental calculations.

AB - Thermal fluctuations at the interface between two thin liquid films of polyisoprene and oligometric styrene was affected by an external electric fields. A characteristic growth rate enhanced the interfacial fluctuations with a well-defined wavelength. The change in surface/interfacial energy when going from the thin film to the bilayer case resulted a substantial reduction in feature size confirmed by theoretical and experimental calculations.

UR - https://www.scopus.com/pages/publications/0034825372

U2 - 10.1063/1.1338125

DO - 10.1063/1.1338125

M3 - Article

AN - SCOPUS:0034825372

SN - 0021-9606

VL - 114

SP - 2377

EP - 2381

JO - Journal of Chemical Physics

JF - Journal of Chemical Physics

IS - 5

ER -

Electric field induced instabilities at liquid/liquid interfaces

Abstract

Access to Document

Fingerprint

Cite this