Electric field induced instabilities at liquid/liquid interfaces

Zhiqun Lin, Tobias Kerle, Shenda M. Baker, David A. Hoagland, Erik Schärfer, Ullrich Steiner, Thomas P. Russell

Research output: Contribution to journalArticlepeer-review

186 Scopus citations

Abstract

Thermal fluctuations at the interface between two thin liquid films of polyisoprene and oligometric styrene was affected by an external electric fields. A characteristic growth rate enhanced the interfacial fluctuations with a well-defined wavelength. The change in surface/interfacial energy when going from the thin film to the bilayer case resulted a substantial reduction in feature size confirmed by theoretical and experimental calculations.

Original languageEnglish
Pages (from-to)2377-2381
Number of pages5
JournalJournal of Chemical Physics
Volume114
Issue number5
DOIs
StatePublished - 2001

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