Effects of surfactant on surface morphology and orientation of Nb-doped Bi4Ti3O12 thin films

Sang Su Kim; Eun Kyung Choi; Jong Kuk Kim; Jin Soo Kim; Tae Kwon Song; Jinheung Kim

Effects of surfactant on surface morphology and orientation of Nb-doped Bi₄Ti₃O₁₂ thin films

Sang Su Kim, Eun Kyung Choi, Jong Kuk Kim, Jin Soo Kim, Tae Kwon Song, Jinheung Kim

Department of Chemistry & Nanoscience

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

We have tried to use surfactants in order to tune the shape and orientation of Nb-doped Bi₄Ti₁₃O₁₂ (BITNb) thin films. BITNb thin films were prepared on Pt(111)/Ti/SiO₂/Si(100) substrates by a metalorganic solution deposition method. The precursor solution for the BITNb thin films was modified with adding surfactant cetyltrimethylammonium bromide in acid or basic atmospheres. The measured XRD patterns revealed that the BITNb thin film prepared with a surfactant in acid atmosphere showed only a Bi₄Ti₃O₁₂-type phase with highly c-axis orientation. However, for the BITNb thin film prepared without surfactant showed random orientation. The remanent polarization (2P_r) and the coercive field (2E_c) of BITNb thin films with c-axis and random orientation were 2.0 μC/cm² and 14.9 kV/cm, and 12.3 μC/cm² and 113.9 kV/cm, respectively.

Original language	English
Pages (from-to)	S1126-S1129
Journal	Journal of the Korean Physical Society
Volume	42
Issue number	SUPPL.
State	Published - Apr 2003

Keywords

BiTiO
Ferroelectric Property
Orientation
Surfactant
Thin Film

Cite this

@article{96691bcad4ba440e80d9904760bdaa84,

title = "Effects of surfactant on surface morphology and orientation of Nb-doped Bi4Ti3O12 thin films",

abstract = "We have tried to use surfactants in order to tune the shape and orientation of Nb-doped Bi4Ti13O12 (BITNb) thin films. BITNb thin films were prepared on Pt(111)/Ti/SiO2/Si(100) substrates by a metalorganic solution deposition method. The precursor solution for the BITNb thin films was modified with adding surfactant cetyltrimethylammonium bromide in acid or basic atmospheres. The measured XRD patterns revealed that the BITNb thin film prepared with a surfactant in acid atmosphere showed only a Bi4Ti3O12-type phase with highly c-axis orientation. However, for the BITNb thin film prepared without surfactant showed random orientation. The remanent polarization (2Pr) and the coercive field (2Ec) of BITNb thin films with c-axis and random orientation were 2.0 μC/cm2 and 14.9 kV/cm, and 12.3 μC/cm2 and 113.9 kV/cm, respectively.",

keywords = "BiTiO, Ferroelectric Property, Orientation, Surfactant, Thin Film",

author = "Kim, {Sang Su} and Choi, {Eun Kyung} and Kim, {Jong Kuk} and Kim, {Jin Soo} and Song, {Tae Kwon} and Jinheung Kim",

year = "2003",

month = apr,

language = "English",

volume = "42",

pages = "S1126--S1129",

journal = "Journal of the Korean Physical Society",

issn = "0374-4884",

publisher = "Korean Physical Society",

number = "SUPPL.",

}

TY - JOUR

T1 - Effects of surfactant on surface morphology and orientation of Nb-doped Bi4Ti3O12 thin films

AU - Kim, Sang Su

AU - Choi, Eun Kyung

AU - Kim, Jong Kuk

AU - Kim, Jin Soo

AU - Song, Tae Kwon

AU - Kim, Jinheung

PY - 2003/4

Y1 - 2003/4

N2 - We have tried to use surfactants in order to tune the shape and orientation of Nb-doped Bi4Ti13O12 (BITNb) thin films. BITNb thin films were prepared on Pt(111)/Ti/SiO2/Si(100) substrates by a metalorganic solution deposition method. The precursor solution for the BITNb thin films was modified with adding surfactant cetyltrimethylammonium bromide in acid or basic atmospheres. The measured XRD patterns revealed that the BITNb thin film prepared with a surfactant in acid atmosphere showed only a Bi4Ti3O12-type phase with highly c-axis orientation. However, for the BITNb thin film prepared without surfactant showed random orientation. The remanent polarization (2Pr) and the coercive field (2Ec) of BITNb thin films with c-axis and random orientation were 2.0 μC/cm2 and 14.9 kV/cm, and 12.3 μC/cm2 and 113.9 kV/cm, respectively.

AB - We have tried to use surfactants in order to tune the shape and orientation of Nb-doped Bi4Ti13O12 (BITNb) thin films. BITNb thin films were prepared on Pt(111)/Ti/SiO2/Si(100) substrates by a metalorganic solution deposition method. The precursor solution for the BITNb thin films was modified with adding surfactant cetyltrimethylammonium bromide in acid or basic atmospheres. The measured XRD patterns revealed that the BITNb thin film prepared with a surfactant in acid atmosphere showed only a Bi4Ti3O12-type phase with highly c-axis orientation. However, for the BITNb thin film prepared without surfactant showed random orientation. The remanent polarization (2Pr) and the coercive field (2Ec) of BITNb thin films with c-axis and random orientation were 2.0 μC/cm2 and 14.9 kV/cm, and 12.3 μC/cm2 and 113.9 kV/cm, respectively.

KW - BiTiO

KW - Ferroelectric Property

KW - Orientation

KW - Surfactant

KW - Thin Film

UR - http://www.scopus.com/inward/record.url?scp=0038649288&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0038649288

SN - 0374-4884

VL - 42

SP - S1126-S1129

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

IS - SUPPL.

ER -

Effects of surfactant on surface morphology and orientation of Nb-doped Bi4Ti3O12 thin films

Abstract

Keywords

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Cite this

Effects of surfactant on surface morphology and orientation of Nb-doped Bi₄Ti₃O₁₂ thin films