Dynamics of space and polarization charges of ferroelectric thin films measured by atomic force microscopy

Y. J. Oh; J. H. Lee; W. Jo

doi:10.1016/j.ultramic.2005.12.015

Dynamics of space and polarization charges of ferroelectric thin films measured by atomic force microscopy

Y. J. Oh, J. H. Lee, W. Jo

Department of Physics

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

Retention behavior and local hysteresis characteristics in Pb(Zr_0.52Ti_0.48)O₃ (PZT) thin films on Pt electrodes have been investigated by electrostatic force microscopy (EFM). A sol-gel method is used to synthesize PZT thin films and drying conditions are carefully explored over a wide range of temperature. Decay and retention mechanisms of single-poled and reverse-poled regions of the ferroelectric thin films are explained by space charge redistribution. Trapping behavior of space charges is dependent on the nature of interface between ferroelectric thin films and bottom electrodes. Local measurement of polarization-electric field curves by EFM shows inhomogeneous space charge entrapment.

Original language	English
Pages (from-to)	779-784
Number of pages	6
Journal	Ultramicroscopy
Volume	106
Issue number	8-9
DOIs	https://doi.org/10.1016/j.ultramic.2005.12.015
State	Published - Jun 2006

Keywords

Charge redistribution
Electrostatic force microscopy
Polarization
PZT

Access to Document

10.1016/j.ultramic.2005.12.015

Cite this

@article{e961edf574ca41ac9079cdb1bbab5490,

title = "Dynamics of space and polarization charges of ferroelectric thin films measured by atomic force microscopy",

abstract = "Retention behavior and local hysteresis characteristics in Pb(Zr0.52Ti0.48)O3 (PZT) thin films on Pt electrodes have been investigated by electrostatic force microscopy (EFM). A sol-gel method is used to synthesize PZT thin films and drying conditions are carefully explored over a wide range of temperature. Decay and retention mechanisms of single-poled and reverse-poled regions of the ferroelectric thin films are explained by space charge redistribution. Trapping behavior of space charges is dependent on the nature of interface between ferroelectric thin films and bottom electrodes. Local measurement of polarization-electric field curves by EFM shows inhomogeneous space charge entrapment.",

keywords = "Charge redistribution, Electrostatic force microscopy, Polarization, PZT",

author = "Oh, {Y. J.} and Lee, {J. H.} and W. Jo",

note = "Funding Information: The authors express sincere thanks to Dr. J. W. Hong for technical support for scanning probe microscopy. This research was supported by a Grant (code #: 05K1501-02520) from {\textquoteleft}Center for Nanostructured Materials Technology{\textquoteright} under {\textquoteleft}21st Century Frontier R&D Programs{\textquoteright} of the Ministry of Science and Technology, Korea.",

year = "2006",

month = jun,

doi = "10.1016/j.ultramic.2005.12.015",

language = "English",

volume = "106",

pages = "779--784",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

number = "8-9",

}

TY - JOUR

T1 - Dynamics of space and polarization charges of ferroelectric thin films measured by atomic force microscopy

AU - Oh, Y. J.

AU - Lee, J. H.

AU - Jo, W.

N1 - Funding Information: The authors express sincere thanks to Dr. J. W. Hong for technical support for scanning probe microscopy. This research was supported by a Grant (code #: 05K1501-02520) from ‘Center for Nanostructured Materials Technology’ under ‘21st Century Frontier R&D Programs’ of the Ministry of Science and Technology, Korea.

PY - 2006/6

Y1 - 2006/6

N2 - Retention behavior and local hysteresis characteristics in Pb(Zr0.52Ti0.48)O3 (PZT) thin films on Pt electrodes have been investigated by electrostatic force microscopy (EFM). A sol-gel method is used to synthesize PZT thin films and drying conditions are carefully explored over a wide range of temperature. Decay and retention mechanisms of single-poled and reverse-poled regions of the ferroelectric thin films are explained by space charge redistribution. Trapping behavior of space charges is dependent on the nature of interface between ferroelectric thin films and bottom electrodes. Local measurement of polarization-electric field curves by EFM shows inhomogeneous space charge entrapment.

AB - Retention behavior and local hysteresis characteristics in Pb(Zr0.52Ti0.48)O3 (PZT) thin films on Pt electrodes have been investigated by electrostatic force microscopy (EFM). A sol-gel method is used to synthesize PZT thin films and drying conditions are carefully explored over a wide range of temperature. Decay and retention mechanisms of single-poled and reverse-poled regions of the ferroelectric thin films are explained by space charge redistribution. Trapping behavior of space charges is dependent on the nature of interface between ferroelectric thin films and bottom electrodes. Local measurement of polarization-electric field curves by EFM shows inhomogeneous space charge entrapment.

KW - Charge redistribution

KW - Electrostatic force microscopy

KW - Polarization

KW - PZT

UR - http://www.scopus.com/inward/record.url?scp=33745633575&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2005.12.015

DO - 10.1016/j.ultramic.2005.12.015

M3 - Article

C2 - 16675118

AN - SCOPUS:33745633575

SN - 0304-3991

VL - 106

SP - 779

EP - 784

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 8-9

ER -

Dynamics of space and polarization charges of ferroelectric thin films measured by atomic force microscopy

Abstract

Keywords

Access to Document

Fingerprint

Cite this