| Original language | English |
|---|---|
| Pages (from-to) | 761 |
| Number of pages | 1 |
| Journal | Technical Digest - International Electron Devices Meeting, IEDM |
| State | Published - 2003 |
| Event | IEEE International Electron Devices Meeting - Washington, DC, United States Duration: 8 Dec 2003 → 10 Dec 2003 |
Displays, Sensors and MEMS - MEMS Sensors
- Luke P. Lee
- , Benedetto Vigna
Research output: Contribution to journal › Conference article › peer-review