Direct measurement of inhomogeneous longitudinal dopant distribution in SiNVVs using nano-probe scanning auger microscopy

U. Givan, J. K. Hyun, E. Koren, J. S. Hammond, D. F. Paul, L. J. Lauhon, Y. Rosenwaks

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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