Abstract
Fountain pen nanolithography was used to deposit controllably nanotube dispersions on a silicon substrate with high spatial precision. The deposited structures were analysed using atomic force microscopy, scanning electron microscopy and polarised Raman spectroscopy. The Raman spectroscopy showed that the deposited nanotubes had a very high degree of alignment with around 90% of the nanotubes aligned at an angle less than 30 ° from the direction of writing.
Original language | English |
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Pages (from-to) | 279-284 |
Number of pages | 6 |
Journal | Materials Express |
Volume | 1 |
Issue number | 4 |
DOIs | |
State | Published - 2011 |
Keywords
- Aligned deposition
- Carbon nanotubes
- Fountain pen nanolithography
- Polarised raman spectroscopy