Fingerprint
Dive into the research topics of 'Different Proposed Analysis with TCAD for Catastrophic Large Area Failure due to Radiation Stress on 4H-SiC Schottky Diode'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Different Proposed Analysis with TCAD for Catastrophic Large Area Failure due to Radiation Stress on 4H-SiC Schottky Diode
Hyeokjae Lee, Ji Min Park, Dongwoo Bae, Kiseok Kim, Jae Young Noh, Youngboo Kim, Jisun Park, Hyungsoon Shin
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review