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Different Proposed Analysis with TCAD for Catastrophic Large Area Failure due to Radiation Stress on 4H-SiC Schottky Diode

  • Hyeokjae Lee
  • , Ji Min Park
  • , Dongwoo Bae
  • , Kiseok Kim
  • , Jae Young Noh
  • , Youngboo Kim
  • , Jisun Park
  • , Hyungsoon Shin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

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