Differences in nature of defects between SrBi2Ta2O9 and Bi4Ti3O12

B. H. Park, S. J. Hyun, S. D. Bu, T. W. Noh, J. Lee, H. D. Kim, T. H. Kim, W. Jo

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239 Scopus citations


The nature of defect differences between SrBi2Ta2O9 (SBT) and Bi4Ti3O12 (BTO) films is investigated using X-ray photoemission spectroscopy. The oxygen ions for SBT at the SrTa2O7 perovskite layers are much stable than those at the Bi2O2 layers. While oxygen vacancies on the BTO films could be induced both at the titanium-oxygen octahedra and at the Bi2O2 layers.

Original languageEnglish
Pages (from-to)1907-1909
Number of pages3
JournalApplied Physics Letters
Issue number13
StatePublished - 29 Mar 1999


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