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DIBL-induced program disturb characteristics in 32-nm NAND flash memory array

  • Myounggon Kang
  • , Wookghee Hahn
  • , Il Han Park
  • , Juyoung Park
  • , Youngsun Song
  • , Hocheol Lee
  • , Changgyu Eun
  • , Sanghyun Ju
  • , Kihwan Choi
  • , Youngho Lim
  • , Seunghyun Jang
  • , Seongjae Cho
  • , Byung Gook Park
  • , Hyungcheol Shin

Research output: Contribution to journal › Article › peer-review

11 Scopus citations

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