DIBL-induced program disturb characteristics in 32-nm NAND flash memory array

Myounggon Kang, Wookghee Hahn, Il Han Park, Juyoung Park, Youngsun Song, Hocheol Lee, Changgyu Eun, Sanghyun Ju, Kihwan Choi, Youngho Lim, Seunghyun Jang, Seongjae Cho, Byung Gook Park, Hyungcheol Shin

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Fingerprint

Dive into the research topics of 'DIBL-induced program disturb characteristics in 32-nm NAND flash memory array'. Together they form a unique fingerprint.

Engineering

Medicine and Dentistry