Abstract
Diameter-dependent Raman scattering in single tapered silicon nanowires is measured and quantitatively reproduced by modeling with finite-difference time-domain simulations. Single crystal tapered silicon nanowires were produced by homoepitaxial radial growth concurrent with vapor-liquid-solid axial growth. Multiple electromagnetic resonances along the nanowire induce broad band light absorption and scattering. Observed Raman scattering intensities for multiple polarization configurations are reproduced by a model that accounts for the internal electromagnetic mode structure of both the exciting and scattered light. Consequences for the application of Stokes to anti-Stokes intensity ratio for the estimation of lattice temperature are discussed.
Original language | English |
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Pages (from-to) | 2266-2271 |
Number of pages | 6 |
Journal | Nano Letters |
Volume | 12 |
Issue number | 5 |
DOIs | |
State | Published - 9 May 2012 |
Keywords
- FDTD
- Nanowire
- Raman
- modeling
- optical properties