Determination of the Poisson ratio of (001) and (111) oriented thin films of In 2O 3 by synchrotron-based x-ray diffraction
- K. H.L. Zhang
- , A. Regoutz
- , R. G. Palgrave
- , D. J. Payne
- , R. G. Egdell
- , A. Walsh
- , S. P. Collins
- , D. Wermeille
- , R. A. Cowley
Research output: Contribution to journal › Article › peer-review
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