Determination of the Poisson ratio of (001) and (111) oriented thin films of In 2O 3 by synchrotron-based x-ray diffraction

K. H.L. Zhang; A. Regoutz; R. G. Palgrave; D. J. Payne; R. G. Egdell; A. Walsh; S. P. Collins; D. Wermeille; R. A. Cowley

doi:10.1103/PhysRevB.84.233301

Determination of the Poisson ratio of (001) and (111) oriented thin films of In ₂O ₃ by synchrotron-based x-ray diffraction

K. H.L. Zhang, A. Regoutz, R. G. Palgrave, D. J. Payne, R. G. Egdell, A. Walsh, S. P. Collins, D. Wermeille, R. A. Cowley

Department of Physics

Research output: Contribution to journal › Article › peer-review

21 Scopus citations

Abstract

The Poisson ratio ν of In ₂O ₃ has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO ₂ substrates. The experimental results are in good agreement with values for ν calculated using atomistic simulation procedures.

Original language	English
Article number	233301
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	84
Issue number	23
DOIs	https://doi.org/10.1103/PhysRevB.84.233301
State	Published - 1 Dec 2011

Access to Document

10.1103/PhysRevB.84.233301

Cite this

Zhang, K. H. L., Regoutz, A., Palgrave, R. G., Payne, D. J., Egdell, R. G., Walsh, A., Collins, S. P., Wermeille, D., & Cowley, R. A. (2011). Determination of the Poisson ratio of (001) and (111) oriented thin films of In ₂O ₃ by synchrotron-based x-ray diffraction. Physical Review B - Condensed Matter and Materials Physics, 84(23), Article 233301. https://doi.org/10.1103/PhysRevB.84.233301

@article{a3631a70b8aa4846a9da3449be35f163,

title = "Determination of the Poisson ratio of (001) and (111) oriented thin films of In 2O 3 by synchrotron-based x-ray diffraction",

abstract = "The Poisson ratio ν of In 2O 3 has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO 2 substrates. The experimental results are in good agreement with values for ν calculated using atomistic simulation procedures.",

author = "Zhang, \{K. H.L.\} and A. Regoutz and Palgrave, \{R. G.\} and Payne, \{D. J.\} and Egdell, \{R. G.\} and A. Walsh and Collins, \{S. P.\} and D. Wermeille and Cowley, \{R. A.\}",

year = "2011",

month = dec,

day = "1",

doi = "10.1103/PhysRevB.84.233301",

language = "English",

volume = "84",

journal = "Physical Review B - Condensed Matter and Materials Physics",

issn = "1098-0121",

publisher = "American Physical Society",

number = "23",

}

Zhang, KHL, Regoutz, A, Palgrave, RG, Payne, DJ, Egdell, RG, Walsh, A, Collins, SP, Wermeille, D & Cowley, RA 2011, 'Determination of the Poisson ratio of (001) and (111) oriented thin films of In ₂O ₃ by synchrotron-based x-ray diffraction', Physical Review B - Condensed Matter and Materials Physics, vol. 84, no. 23, 233301. https://doi.org/10.1103/PhysRevB.84.233301

TY - JOUR

T1 - Determination of the Poisson ratio of (001) and (111) oriented thin films of In 2O 3 by synchrotron-based x-ray diffraction

AU - Zhang, K. H.L.

AU - Regoutz, A.

AU - Palgrave, R. G.

AU - Payne, D. J.

AU - Egdell, R. G.

AU - Walsh, A.

AU - Collins, S. P.

AU - Wermeille, D.

AU - Cowley, R. A.

PY - 2011/12/1

Y1 - 2011/12/1

N2 - The Poisson ratio ν of In 2O 3 has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO 2 substrates. The experimental results are in good agreement with values for ν calculated using atomistic simulation procedures.

AB - The Poisson ratio ν of In 2O 3 has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO 2 substrates. The experimental results are in good agreement with values for ν calculated using atomistic simulation procedures.

UR - https://www.scopus.com/pages/publications/84855372487

U2 - 10.1103/PhysRevB.84.233301

DO - 10.1103/PhysRevB.84.233301

M3 - Article

AN - SCOPUS:84855372487

SN - 1098-0121

VL - 84

JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

IS - 23

M1 - 233301

ER -

Determination of the Poisson ratio of (001) and (111) oriented thin films of In 2O 3 by synchrotron-based x-ray diffraction

Abstract

Access to Document

Fingerprint

Cite this

Determination of the Poisson ratio of (001) and (111) oriented thin films of In ₂O ₃ by synchrotron-based x-ray diffraction