Determination of the Poisson ratio of (001) and (111) oriented thin films of In 2O 3 by synchrotron-based x-ray diffraction

K. H.L. Zhang; A. Regoutz; R. G. Palgrave; D. J. Payne; R. G. Egdell; A. Walsh; S. P. Collins; D. Wermeille; R. A. Cowley

doi:10.1103/PhysRevB.84.233301

Determination of the Poisson ratio of (001) and (111) oriented thin films of In ₂O ₃ by synchrotron-based x-ray diffraction

K. H.L. Zhang
, A. Regoutz
, R. G. Palgrave
, D. J. Payne
, R. G. Egdell
, A. Walsh
, S. P. Collins
, D. Wermeille
, R. A. Cowley

Department of Physics

Research output: Contribution to journal › Article › peer-review

21 Scopus citations

Abstract

The Poisson ratio ν of In ₂O ₃ has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO ₂ substrates. The experimental results are in good agreement with values for ν calculated using atomistic simulation procedures.

Original language	English
Article number	233301
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	84
Issue number	23
DOIs	https://doi.org/10.1103/PhysRevB.84.233301
State	Published - 1 Dec 2011

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10.1103/PhysRevB.84.233301

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Zhang, K. H. L., Regoutz, A., Palgrave, R. G., Payne, D. J., Egdell, R. G., Walsh, A., Collins, S. P., Wermeille, D., & Cowley, R. A. (2011). Determination of the Poisson ratio of (001) and (111) oriented thin films of In ₂O ₃ by synchrotron-based x-ray diffraction. Physical Review B - Condensed Matter and Materials Physics, 84(23), Article 233301. https://doi.org/10.1103/PhysRevB.84.233301

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title = "Determination of the Poisson ratio of (001) and (111) oriented thin films of In 2O 3 by synchrotron-based x-ray diffraction",

abstract = "The Poisson ratio ν of In 2O 3 has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO 2 substrates. The experimental results are in good agreement with values for ν calculated using atomistic simulation procedures.",

author = "Zhang, \{K. H.L.\} and A. Regoutz and Palgrave, \{R. G.\} and Payne, \{D. J.\} and Egdell, \{R. G.\} and A. Walsh and Collins, \{S. P.\} and D. Wermeille and Cowley, \{R. A.\}",

year = "2011",

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doi = "10.1103/PhysRevB.84.233301",

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Zhang, KHL, Regoutz, A, Palgrave, RG, Payne, DJ, Egdell, RG, Walsh, A, Collins, SP, Wermeille, D & Cowley, RA 2011, 'Determination of the Poisson ratio of (001) and (111) oriented thin films of In ₂O ₃ by synchrotron-based x-ray diffraction', Physical Review B - Condensed Matter and Materials Physics, vol. 84, no. 23, 233301. https://doi.org/10.1103/PhysRevB.84.233301

TY - JOUR

T1 - Determination of the Poisson ratio of (001) and (111) oriented thin films of In 2O 3 by synchrotron-based x-ray diffraction

AU - Zhang, K. H.L.

AU - Regoutz, A.

AU - Palgrave, R. G.

AU - Payne, D. J.

AU - Egdell, R. G.

AU - Walsh, A.

AU - Collins, S. P.

AU - Wermeille, D.

AU - Cowley, R. A.

PY - 2011/12/1

Y1 - 2011/12/1

N2 - The Poisson ratio ν of In 2O 3 has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO 2 substrates. The experimental results are in good agreement with values for ν calculated using atomistic simulation procedures.

AB - The Poisson ratio ν of In 2O 3 has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO 2 substrates. The experimental results are in good agreement with values for ν calculated using atomistic simulation procedures.

UR - https://www.scopus.com/pages/publications/84855372487

U2 - 10.1103/PhysRevB.84.233301

DO - 10.1103/PhysRevB.84.233301

M3 - Article

AN - SCOPUS:84855372487

SN - 1098-0121

VL - 84

JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

IS - 23

M1 - 233301

ER -

Determination of the Poisson ratio of (001) and (111) oriented thin films of In 2O 3 by synchrotron-based x-ray diffraction

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Determination of the Poisson ratio of (001) and (111) oriented thin films of In ₂O ₃ by synchrotron-based x-ray diffraction