Determination of the Pockels tensor component ratio by a Mach-Zehnder interferometry in a poled polymer thin film

J. W. Wu, H. R. Cho, M. J. Shin, S. H. Han

Research output: Contribution to journalConference articlepeer-review

Abstract

A Mach-Zehnder interferometry is employed to measure the Pockels coefficients in a poled polymer thin film in both the coplanar and the parallel-plate electrode structures. The modulated intensity of the Mach-Zehnder interferometer is investigated as a function of the optical bias in the reference arm, the modulation voltage applied to the film, the polarization angle of the incident light, and the angle of incidence on the film, as a complete analysis of the optical characterization of an electro-optic polymer film. The Mach-Zehnder interferometry measurement of the Pockels coefficients has an advantage over the single-beam polarization interferometry in permitting the independent determination of the Pockels tensor components, r13 and r33.

Original languageEnglish
Pages (from-to)95-102
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3147
DOIs
StatePublished - 1997
EventNonlinear Optical Properties of Organic Materials X - San Diego, CA, United States
Duration: 30 Jul 19971 Aug 1997

Keywords

  • Mach-Zehnder interferometer
  • Nonlinear optical polymer
  • The electro-optic effect
  • The Pockels effect

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