Determination of the Pockels tensor component ratio by a Mach-Zehnder interferometry in a poled polymer thin film

J. W. Wu; H. R. Cho; M. J. Shin; S. H. Han

doi:10.1117/12.284242

Determination of the Pockels tensor component ratio by a Mach-Zehnder interferometry in a poled polymer thin film

J. W. Wu, H. R. Cho, M. J. Shin, S. H. Han

Department of Physics

Research output: Contribution to journal › Conference article › peer-review

Abstract

A Mach-Zehnder interferometry is employed to measure the Pockels coefficients in a poled polymer thin film in both the coplanar and the parallel-plate electrode structures. The modulated intensity of the Mach-Zehnder interferometer is investigated as a function of the optical bias in the reference arm, the modulation voltage applied to the film, the polarization angle of the incident light, and the angle of incidence on the film, as a complete analysis of the optical characterization of an electro-optic polymer film. The Mach-Zehnder interferometry measurement of the Pockels coefficients has an advantage over the single-beam polarization interferometry in permitting the independent determination of the Pockels tensor components, r₁₃ and r₃₃.

Original language	English
Pages (from-to)	95-102
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3147
DOIs	https://doi.org/10.1117/12.284242
State	Published - 1997
Event	Nonlinear Optical Properties of Organic Materials X - San Diego, CA, United States Duration: 30 Jul 1997 → 1 Aug 1997

Keywords

Mach-Zehnder interferometer
Nonlinear optical polymer
The Pockels effect
The electro-optic effect

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10.1117/12.284242

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title = "Determination of the Pockels tensor component ratio by a Mach-Zehnder interferometry in a poled polymer thin film",

abstract = "A Mach-Zehnder interferometry is employed to measure the Pockels coefficients in a poled polymer thin film in both the coplanar and the parallel-plate electrode structures. The modulated intensity of the Mach-Zehnder interferometer is investigated as a function of the optical bias in the reference arm, the modulation voltage applied to the film, the polarization angle of the incident light, and the angle of incidence on the film, as a complete analysis of the optical characterization of an electro-optic polymer film. The Mach-Zehnder interferometry measurement of the Pockels coefficients has an advantage over the single-beam polarization interferometry in permitting the independent determination of the Pockels tensor components, r13 and r33.",

keywords = "Mach-Zehnder interferometer, Nonlinear optical polymer, The Pockels effect, The electro-optic effect",

author = "Wu, {J. W.} and Cho, {H. R.} and Shin, {M. J.} and Han, {S. H.}",

year = "1997",

doi = "10.1117/12.284242",

language = "English",

volume = "3147",

pages = "95--102",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Nonlinear Optical Properties of Organic Materials X ; Conference date: 30-07-1997 Through 01-08-1997",

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TY - JOUR

T1 - Determination of the Pockels tensor component ratio by a Mach-Zehnder interferometry in a poled polymer thin film

AU - Wu, J. W.

AU - Cho, H. R.

AU - Shin, M. J.

AU - Han, S. H.

PY - 1997

Y1 - 1997

N2 - A Mach-Zehnder interferometry is employed to measure the Pockels coefficients in a poled polymer thin film in both the coplanar and the parallel-plate electrode structures. The modulated intensity of the Mach-Zehnder interferometer is investigated as a function of the optical bias in the reference arm, the modulation voltage applied to the film, the polarization angle of the incident light, and the angle of incidence on the film, as a complete analysis of the optical characterization of an electro-optic polymer film. The Mach-Zehnder interferometry measurement of the Pockels coefficients has an advantage over the single-beam polarization interferometry in permitting the independent determination of the Pockels tensor components, r13 and r33.

AB - A Mach-Zehnder interferometry is employed to measure the Pockels coefficients in a poled polymer thin film in both the coplanar and the parallel-plate electrode structures. The modulated intensity of the Mach-Zehnder interferometer is investigated as a function of the optical bias in the reference arm, the modulation voltage applied to the film, the polarization angle of the incident light, and the angle of incidence on the film, as a complete analysis of the optical characterization of an electro-optic polymer film. The Mach-Zehnder interferometry measurement of the Pockels coefficients has an advantage over the single-beam polarization interferometry in permitting the independent determination of the Pockels tensor components, r13 and r33.

KW - Mach-Zehnder interferometer

KW - Nonlinear optical polymer

KW - The Pockels effect

KW - The electro-optic effect

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U2 - 10.1117/12.284242

DO - 10.1117/12.284242

M3 - Conference article

AN - SCOPUS:0031289326

SN - 0277-786X

VL - 3147

SP - 95

EP - 102

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Nonlinear Optical Properties of Organic Materials X

Y2 - 30 July 1997 through 1 August 1997

ER -

Determination of the Pockels tensor component ratio by a Mach-Zehnder interferometry in a poled polymer thin film

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