TY - JOUR
T1 - Descriptors for Electron and Hole Charge Carriers in Metal Oxides
AU - Davies, Daniel W.
AU - Savory, Christopher N.
AU - Frost, Jarvist M.
AU - Scanlon, David O.
AU - Morgan, Benjamin J.
AU - Walsh, Aron
N1 - Publisher Copyright:
Copyright © 2019 American Chemical Society.
PY - 2020/1/16
Y1 - 2020/1/16
N2 - Metal oxides can act as insulators, semiconductors, or metals depending on their chemical composition and crystal structure. Metal oxide semiconductors, which support equilibrium populations of electron and hole charge carriers, have widespread applications including batteries, solar cells, and display technologies. It is often difficult to predict in advance whether these materials will exhibit localized or delocalized charge carriers upon oxidation or reduction. We combine data from first-principles calculations of the electronic structure and dielectric response of 214 metal oxides to predict the energetic driving force for carrier localization and transport. We assess descriptors based on the carrier effective mass, static polaron binding energy, and Fröhlich electron-phonon coupling. Numerical analysis allows us to assign p- and n-type transport of a metal oxide to three classes: (i) band transport with high mobility; (ii) small polaron transport with low mobility; and (iii) intermediate behavior. The results of this classification agree with observations regarding carrier dynamics and lifetimes and are used to predict 10 candidate p-type oxides.
AB - Metal oxides can act as insulators, semiconductors, or metals depending on their chemical composition and crystal structure. Metal oxide semiconductors, which support equilibrium populations of electron and hole charge carriers, have widespread applications including batteries, solar cells, and display technologies. It is often difficult to predict in advance whether these materials will exhibit localized or delocalized charge carriers upon oxidation or reduction. We combine data from first-principles calculations of the electronic structure and dielectric response of 214 metal oxides to predict the energetic driving force for carrier localization and transport. We assess descriptors based on the carrier effective mass, static polaron binding energy, and Fröhlich electron-phonon coupling. Numerical analysis allows us to assign p- and n-type transport of a metal oxide to three classes: (i) band transport with high mobility; (ii) small polaron transport with low mobility; and (iii) intermediate behavior. The results of this classification agree with observations regarding carrier dynamics and lifetimes and are used to predict 10 candidate p-type oxides.
UR - http://www.scopus.com/inward/record.url?scp=85077950630&partnerID=8YFLogxK
U2 - 10.1021/acs.jpclett.9b03398
DO - 10.1021/acs.jpclett.9b03398
M3 - Article
C2 - 31875393
AN - SCOPUS:85077950630
SN - 1948-7185
VL - 11
SP - 438
EP - 444
JO - Journal of Physical Chemistry Letters
JF - Journal of Physical Chemistry Letters
IS - 2
ER -