Dependence of program efficiency on channel conditions regarding NOR-type flash memory devices fabricated on a silicon-on-insulator (SOI) substrate

Seongjae Cho, Il Han Ban, Jung Hoon Lee, Younghwan Son, Jong Duk Lee, Hyungcheol Shin, Byung Gook Park

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'Dependence of program efficiency on channel conditions regarding NOR-type flash memory devices fabricated on a silicon-on-insulator (SOI) substrate'. Together they form a unique fingerprint.

Engineering