Defect Identification of Nitrogen-Doped Graphene on Pt (111) Using Atomic Force Microscopy and Scanning Tunneling Microscopy

Hyunmin Kang, Jeong Ah Seo, Taegeun Yoon, Yongtae Cha, Jiwon Park, Bong Gyu Shin, Andreas J. Heinrich, Hyo Won Kim, Jungseok Chae, Young Jae Song

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