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Current-Crowding Effect in Diagonal MOSFET’s
Hyunsang Hwang
, Hyungsoon Shir
, Dae Gwan Kang
, Dong Hyuk Ju
Electronic and Electrical Engineering
Research output
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Contribution to journal
›
Article
›
peer-review
7
Scopus citations
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Engineering
Metal-Oxide-Semiconductor Field-Effect Transistor
100%
Gate Bias
50%
Degradation Rate
50%
Gate Voltage
25%
Device Structure
25%