Abstract
A comprehensive analysis of write operations (SET and RESET) in a resistance-change memory (resistive random access memory) crossbar array is carried out. Three types of resistive switching memory cells-nonlinear, rectifying-SET, and rectifying-RESET-are compared with each other in terms of voltage delivery, current delivery, and power consumption. Two different write schemes, V/2 and V/3, were considered, and the V/2 write scheme is preferred due to much lower power consumption. A simple numerical method was developed that simulates entire current flows and node voltages within a crossbar array and provides a quantitative tool for the accurate analysis of crossbar arrays and guidelines for developing reliable write operation.
Original language | English |
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Article number | 6835201 |
Pages (from-to) | 2820-2826 |
Number of pages | 7 |
Journal | IEEE Transactions on Electron Devices |
Volume | 61 |
Issue number | 8 |
DOIs | |
State | Published - Aug 2014 |
Keywords
- Crossbar
- resistive random access memory (RRAM)
- selector device
- sneak path
- write margin
- write scheme.