Conductance and EPR study of the endohedral fullerene Li@C60

V. N. Popok; I. I. Azarko; A. V. Gromov; M. Jönsson; A. Lassesson; E. E.B. Campbell

doi:10.1016/j.ssc.2004.12.014

Conductance and EPR study of the endohedral fullerene Li@C₆₀

V. N. Popok, I. I. Azarko, A. V. Gromov, M. Jönsson, A. Lassesson, E. E.B. Campbell

Department of Physics

Research output: Contribution to journal › Article › peer-review

33 Scopus citations

Abstract

Thin films and bulk samples of endohedral fullerenes Li@C₆₀ are studied using current-voltage (I-V) measurements and electron paramagnetic resonance (EPR). Electrical measurements show a linear behaviour for the I-V curves and give an average resistivity of ca. 1.5 kΩcm for thin Li@C ₆₀ films deposited in vacuum, four orders of magnitude lower than C₆₀ samples. A drastic effect on the conductance, lowering it to the values typical for C₆₀, is observed when the Li@C₆₀ samples are exposed to ambient atmosphere. No additional paramagnetic centres (PCs) are found for the Li@C₆₀ compared to C₆₀ that can be related to the formation of dimers or trimers of the endohedral fullerene molecules. However, the presence of the Li atoms in the fullerene cages contributes to a change of the spin-spin and spin-lattice relaxation times. The spin-lattice relaxation time becomes four orders of magnitude longer compared to the spin-spin relaxation time.

Original language	English
Pages (from-to)	499-503
Number of pages	5
Journal	Solid State Communications
Volume	133
Issue number	8
DOIs	https://doi.org/10.1016/j.ssc.2004.12.014
State	Published - Feb 2005

Bibliographical note

Funding Information:
The authors are grateful to The Swedish Research Council (VR) for financial support.

Keywords

A. Fullerene
D. Electronic transport
E. Electron paramagnetic resonance

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10.1016/j.ssc.2004.12.014

Cite this

@article{3d72fb2283014e8fb3961f17b2973da8,

title = "Conductance and EPR study of the endohedral fullerene Li@C60",

abstract = "Thin films and bulk samples of endohedral fullerenes Li@C60 are studied using current-voltage (I-V) measurements and electron paramagnetic resonance (EPR). Electrical measurements show a linear behaviour for the I-V curves and give an average resistivity of ca. 1.5 kΩcm for thin Li@C 60 films deposited in vacuum, four orders of magnitude lower than C60 samples. A drastic effect on the conductance, lowering it to the values typical for C60, is observed when the Li@C60 samples are exposed to ambient atmosphere. No additional paramagnetic centres (PCs) are found for the Li@C60 compared to C60 that can be related to the formation of dimers or trimers of the endohedral fullerene molecules. However, the presence of the Li atoms in the fullerene cages contributes to a change of the spin-spin and spin-lattice relaxation times. The spin-lattice relaxation time becomes four orders of magnitude longer compared to the spin-spin relaxation time.",

keywords = "A. Fullerene, D. Electronic transport, E. Electron paramagnetic resonance",

author = "Popok, {V. N.} and Azarko, {I. I.} and Gromov, {A. V.} and M. J{\"o}nsson and A. Lassesson and Campbell, {E. E.B.}",

note = "Funding Information: The authors are grateful to The Swedish Research Council (VR) for financial support.",

year = "2005",

month = feb,

doi = "10.1016/j.ssc.2004.12.014",

language = "English",

volume = "133",

pages = "499--503",

journal = "Solid State Communications",

issn = "0038-1098",

publisher = "Elsevier Ltd.",

number = "8",

}

TY - JOUR

T1 - Conductance and EPR study of the endohedral fullerene Li@C60

AU - Popok, V. N.

AU - Azarko, I. I.

AU - Gromov, A. V.

AU - Jönsson, M.

AU - Lassesson, A.

AU - Campbell, E. E.B.

N1 - Funding Information: The authors are grateful to The Swedish Research Council (VR) for financial support.

PY - 2005/2

Y1 - 2005/2

N2 - Thin films and bulk samples of endohedral fullerenes Li@C60 are studied using current-voltage (I-V) measurements and electron paramagnetic resonance (EPR). Electrical measurements show a linear behaviour for the I-V curves and give an average resistivity of ca. 1.5 kΩcm for thin Li@C 60 films deposited in vacuum, four orders of magnitude lower than C60 samples. A drastic effect on the conductance, lowering it to the values typical for C60, is observed when the Li@C60 samples are exposed to ambient atmosphere. No additional paramagnetic centres (PCs) are found for the Li@C60 compared to C60 that can be related to the formation of dimers or trimers of the endohedral fullerene molecules. However, the presence of the Li atoms in the fullerene cages contributes to a change of the spin-spin and spin-lattice relaxation times. The spin-lattice relaxation time becomes four orders of magnitude longer compared to the spin-spin relaxation time.

AB - Thin films and bulk samples of endohedral fullerenes Li@C60 are studied using current-voltage (I-V) measurements and electron paramagnetic resonance (EPR). Electrical measurements show a linear behaviour for the I-V curves and give an average resistivity of ca. 1.5 kΩcm for thin Li@C 60 films deposited in vacuum, four orders of magnitude lower than C60 samples. A drastic effect on the conductance, lowering it to the values typical for C60, is observed when the Li@C60 samples are exposed to ambient atmosphere. No additional paramagnetic centres (PCs) are found for the Li@C60 compared to C60 that can be related to the formation of dimers or trimers of the endohedral fullerene molecules. However, the presence of the Li atoms in the fullerene cages contributes to a change of the spin-spin and spin-lattice relaxation times. The spin-lattice relaxation time becomes four orders of magnitude longer compared to the spin-spin relaxation time.

KW - A. Fullerene

KW - D. Electronic transport

KW - E. Electron paramagnetic resonance

UR - http://www.scopus.com/inward/record.url?scp=12444334633&partnerID=8YFLogxK

U2 - 10.1016/j.ssc.2004.12.014

DO - 10.1016/j.ssc.2004.12.014

M3 - Article

AN - SCOPUS:12444334633

SN - 0038-1098

VL - 133

SP - 499

EP - 503

JO - Solid State Communications

JF - Solid State Communications

IS - 8

ER -