Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy
- Dahyun Nam
- , A. S. Opanasyuk
- , P. V. Koval
- , A. G. Ponomarev
- , Ah Reum Jeong
- , Gee Yeong Kim
- , William Jo
- , Hyeonsik Cheong
Research output: Contribution to journal › Article › peer-review
34
Scopus
citations