Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy

Dahyun Nam, A. S. Opanasyuk, P. V. Koval, A. G. Ponomarev, Ah Reum Jeong, Gee Yeong Kim, William Jo, Hyeonsik Cheong

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