Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy

Dahyun Nam; A. S. Opanasyuk; P. V. Koval; A. G. Ponomarev; Ah Reum Jeong; Gee Yeong Kim; William Jo; Hyeonsik Cheong

doi:10.1016/j.tsf.2014.03.079

Composition variations in Cu₂ZnSnSe₄ thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy

Dahyun Nam, A. S. Opanasyuk, P. V. Koval, A. G. Ponomarev, Ah Reum Jeong, Gee Yeong Kim, William Jo, Hyeonsik Cheong

Department of Physics

Research output: Contribution to journal › Article › peer-review

33 Scopus citations

Abstract

Compositional and structural studies of Cu₂ZnSnSe₄ (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by co-evaporation. The composition of the films measured by two different methods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro-PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample.

Original language	English
Pages (from-to)	109-113
Number of pages	5
Journal	Thin Solid Films
Volume	562
DOIs	https://doi.org/10.1016/j.tsf.2014.03.079
State	Published - 1 Jul 2014

Bibliographical note

Funding Information:
This research was supported by the International Research & Development Program of the National Research Foundation of Korea funded by the Ministry of Science, ICT and Future Planning of Korea (Grant number: 2011-0019204 ) and by the New & Renewable Energy of the Korea Institute of Energy Technology Evaluation and Planning grant funded by the Korea government’s Ministry of Trade, Industry and Energy (No. 20123010010130 ).

Keywords

Confocal microscopy
Copper-zinc-tin selenide
Energy dispersive X-ray spectroscopy
Particle induced X-ray emission
Photoluminescence
Raman spectroscopy
Thin films
X-ray diffraction

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10.1016/j.tsf.2014.03.079

Cite this

Nam, D., Opanasyuk, A. S., Koval, P. V., Ponomarev, A. G., Jeong, A. R., Kim, G. Y., Jo, W., & Cheong, H. (2014). Composition variations in Cu₂ZnSnSe₄ thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy. Thin Solid Films, 562, 109-113. https://doi.org/10.1016/j.tsf.2014.03.079

@article{c46761ee6cce4edfaefed14ed020e321,

title = "Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy",

abstract = "Compositional and structural studies of Cu2ZnSnSe4 (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by co-evaporation. The composition of the films measured by two different methods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro-PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample.",

keywords = "Confocal microscopy, Copper-zinc-tin selenide, Energy dispersive X-ray spectroscopy, Particle induced X-ray emission, Photoluminescence, Raman spectroscopy, Thin films, X-ray diffraction",

author = "Dahyun Nam and Opanasyuk, {A. S.} and Koval, {P. V.} and Ponomarev, {A. G.} and Jeong, {Ah Reum} and Kim, {Gee Yeong} and William Jo and Hyeonsik Cheong",

note = "Funding Information: This research was supported by the International Research & Development Program of the National Research Foundation of Korea funded by the Ministry of Science, ICT and Future Planning of Korea (Grant number: 2011-0019204 ) and by the New & Renewable Energy of the Korea Institute of Energy Technology Evaluation and Planning grant funded by the Korea government{\textquoteright}s Ministry of Trade, Industry and Energy (No. 20123010010130 ).",

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doi = "10.1016/j.tsf.2014.03.079",

language = "English",

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Nam, D, Opanasyuk, AS, Koval, PV, Ponomarev, AG, Jeong, AR, Kim, GY, Jo, W & Cheong, H 2014, 'Composition variations in Cu₂ZnSnSe₄ thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy', Thin Solid Films, vol. 562, pp. 109-113. https://doi.org/10.1016/j.tsf.2014.03.079

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T1 - Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy

AU - Nam, Dahyun

AU - Opanasyuk, A. S.

AU - Koval, P. V.

AU - Ponomarev, A. G.

AU - Jeong, Ah Reum

AU - Kim, Gee Yeong

AU - Jo, William

AU - Cheong, Hyeonsik

N1 - Funding Information: This research was supported by the International Research & Development Program of the National Research Foundation of Korea funded by the Ministry of Science, ICT and Future Planning of Korea (Grant number: 2011-0019204 ) and by the New & Renewable Energy of the Korea Institute of Energy Technology Evaluation and Planning grant funded by the Korea government’s Ministry of Trade, Industry and Energy (No. 20123010010130 ).

PY - 2014/7/1

Y1 - 2014/7/1

N2 - Compositional and structural studies of Cu2ZnSnSe4 (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by co-evaporation. The composition of the films measured by two different methods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro-PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample.

AB - Compositional and structural studies of Cu2ZnSnSe4 (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by co-evaporation. The composition of the films measured by two different methods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro-PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample.

KW - Confocal microscopy

KW - Copper-zinc-tin selenide

KW - Energy dispersive X-ray spectroscopy

KW - Particle induced X-ray emission

KW - Photoluminescence

KW - Raman spectroscopy

KW - Thin films

KW - X-ray diffraction

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