Composition variations in Cu2ZnSnSe4 thin films analyzed by X-ray diffraction, energy dispersive X-ray spectroscopy, particle induced X-ray emission, photoluminescence, and Raman spectroscopy

Dahyun Nam, A. S. Opanasyuk, P. V. Koval, A. G. Ponomarev, Ah Reum Jeong, Gee Yeong Kim, William Jo, Hyeonsik Cheong

Research output: Contribution to journalArticlepeer-review

32 Scopus citations

Abstract

Compositional and structural studies of Cu2ZnSnSe4 (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by co-evaporation. The composition of the films measured by two different methods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro-PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample.

Original languageEnglish
Pages (from-to)109-113
Number of pages5
JournalThin Solid Films
Volume562
DOIs
StatePublished - 1 Jul 2014

Keywords

  • Confocal microscopy
  • Copper-zinc-tin selenide
  • Energy dispersive X-ray spectroscopy
  • Particle induced X-ray emission
  • Photoluminescence
  • Raman spectroscopy
  • Thin films
  • X-ray diffraction

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