Abstract
This article presents the radio frequency small-signal modeling of silicon nanowire (SNW) MOSFET with 30 nm channel length and 5 nm channel radius. Analytical parameter extraction methods are developed by Y-parameter analysis for the proposed equivalent circuit. Y-parameters of SNW MOSFET are obtained by three-dimensional (3D) device simulator. Accuracies of the new model and extracted parameters have been verified by the 3D device simulation data up to 200 GHz. The RMS modeling error of Y-parameter was calculated to be only 1.4%.
| Original language | English |
|---|---|
| Pages (from-to) | 471-473 |
| Number of pages | 3 |
| Journal | Microwave and Optical Technology Letters |
| Volume | 53 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 2011 |
Keywords
- model
- MOSFET
- radio frequency
- silicon nanowire
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