TY - JOUR
T1 - Chemically deposited blocking layers on FTO substrates
T2 - Effect of precursor concentration on photovoltaic performance of dye-sensitized solar cells
AU - Yoo, Beomjin
AU - Kim, Kang Jin
AU - Bang, So Yeon
AU - Ko, Min Jae
AU - Kim, Kyungkon
AU - Park, Nam Gyu
PY - 2010/1/5
Y1 - 2010/1/5
N2 - Blocking layers are formed on the conductive fluorine-doped tin oxide (FTO) substrate by using titanium (IV) bis(ethylacetoacetato) diisopropoxide precursor solutions with different concentration to investigate the effect of the precursor concentration on thickness and morphology of blocking layers and photovoltaic property in dye-sensitized solar cell. Increase in the precursor concentration from 0.05 M to 1.2 M leads to increase in the blocking layer thickness from 10 nm to 240 nm. Besides increase in the thickness, nanoparticulate intralayer morphology is developed as increasing the precursor concentration. Photovoltaic property, especially photocurrent density (JSC), is influenced by the precursor concentration, where JSC increases with increasing the concentration, reaches maximum at around 0.1 M (blocking layer thickness is about 20 nm), decreases gradually up to 0.4 M and become close to the value without blocking layer for further increase in the concentration. Photovoltages increase slightly after formation of blocking layer, but not significantly altered compared with the extent of photocurrent change. It has been found that the precursor concentration with around 0.1 M provides the optimum condition to protect the loss of electrons within our experimental condition and at this condition the photoconversion efficiency is able to be enhanced by about 6% compared with that without blocking layer. Electrochemical impedance spectroscopic study shows that the dependence of photovoltaic property on Ti precursor concentration is closely related to the charge transfer resistance at the blocking layer/electrolyte interface, where the electron loss at near FTO substrate is effectively protected by the blocking layer with the maximum charge transfer resistance.
AB - Blocking layers are formed on the conductive fluorine-doped tin oxide (FTO) substrate by using titanium (IV) bis(ethylacetoacetato) diisopropoxide precursor solutions with different concentration to investigate the effect of the precursor concentration on thickness and morphology of blocking layers and photovoltaic property in dye-sensitized solar cell. Increase in the precursor concentration from 0.05 M to 1.2 M leads to increase in the blocking layer thickness from 10 nm to 240 nm. Besides increase in the thickness, nanoparticulate intralayer morphology is developed as increasing the precursor concentration. Photovoltaic property, especially photocurrent density (JSC), is influenced by the precursor concentration, where JSC increases with increasing the concentration, reaches maximum at around 0.1 M (blocking layer thickness is about 20 nm), decreases gradually up to 0.4 M and become close to the value without blocking layer for further increase in the concentration. Photovoltages increase slightly after formation of blocking layer, but not significantly altered compared with the extent of photocurrent change. It has been found that the precursor concentration with around 0.1 M provides the optimum condition to protect the loss of electrons within our experimental condition and at this condition the photoconversion efficiency is able to be enhanced by about 6% compared with that without blocking layer. Electrochemical impedance spectroscopic study shows that the dependence of photovoltaic property on Ti precursor concentration is closely related to the charge transfer resistance at the blocking layer/electrolyte interface, where the electron loss at near FTO substrate is effectively protected by the blocking layer with the maximum charge transfer resistance.
KW - Blocking layers on FTO
KW - Charge recombination control
KW - Charge transfer resistance
KW - Dye-sensitized solar cell
KW - Efficiency enhancement
UR - http://www.scopus.com/inward/record.url?scp=72149084939&partnerID=8YFLogxK
U2 - 10.1016/j.jelechem.2009.10.005
DO - 10.1016/j.jelechem.2009.10.005
M3 - Article
AN - SCOPUS:72149084939
SN - 1572-6657
VL - 638
SP - 161
EP - 166
JO - Journal of Electroanalytical Chemistry
JF - Journal of Electroanalytical Chemistry
IS - 1
ER -