Charge trapping characteristics of SONOS capacitors with control gates of different work functions during programferase operations

Dong Hua Li, Seongjae Cho, Il Han Park, Jang Gn Yun, Jung Loon Lee, Gil Sung Lee, Doo Hyun Kim, Yoon Kim, Se Hwan Park, Won Bo Sim, Jong Duk Lee, Byung Gook Park

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

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