Charge retention behavior of preferentially oriented and textured Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy

T. Y. Kim; J. H. Lee; Y. J. Oh; M. R. Choi; W. Jo

doi:10.1063/1.2472181

Charge retention behavior of preferentially oriented and textured Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy

T. Y. Kim
, J. H. Lee
, Y. J. Oh
, M. R. Choi
, W. Jo

Department of Physics

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

The authors report charge retention in preferentially (117) oriented and textured c -axis oriented ferroelectric Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy. Surface charges of the films were observed as a function of time in a selected area which consists of a single-poled region and a reverse-poled region. The highly (117) oriented film shows the extended exponential decay with characteristic scaling exponents, n=1.5-1.6. The preferentially c -axis oriented film shows a remarkable retained behavior regardless of the poling. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.

Original language	English
Article number	082901
Journal	Applied Physics Letters
Volume	90
Issue number	8
DOIs	https://doi.org/10.1063/1.2472181
State	Published - 2007

Bibliographical note

Funding Information:
This work was by a grant (Code No. 06K1501-02520) from “Center for Nanostructured Materials Technology” under “21st Century Frontier R&D Programs” of the Ministry of Science and Technology, Korea.

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title = "Charge retention behavior of preferentially oriented and textured Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy",

abstract = "The authors report charge retention in preferentially (117) oriented and textured c -axis oriented ferroelectric Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy. Surface charges of the films were observed as a function of time in a selected area which consists of a single-poled region and a reverse-poled region. The highly (117) oriented film shows the extended exponential decay with characteristic scaling exponents, n=1.5-1.6. The preferentially c -axis oriented film shows a remarkable retained behavior regardless of the poling. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.",

author = "Kim, \{T. Y.\} and Lee, \{J. H.\} and Oh, \{Y. J.\} and Choi, \{M. R.\} and W. Jo",

note = "Funding Information: This work was by a grant (Code No. 06K1501-02520) from “Center for Nanostructured Materials Technology” under “21st Century Frontier R\&D Programs” of the Ministry of Science and Technology, Korea.",

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doi = "10.1063/1.2472181",

language = "English",

volume = "90",

journal = "Applied Physics Letters",

issn = "0003-6951",

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T1 - Charge retention behavior of preferentially oriented and textured Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy

AU - Kim, T. Y.

AU - Lee, J. H.

AU - Oh, Y. J.

AU - Choi, M. R.

AU - Jo, W.

N1 - Funding Information: This work was by a grant (Code No. 06K1501-02520) from “Center for Nanostructured Materials Technology” under “21st Century Frontier R&D Programs” of the Ministry of Science and Technology, Korea.

PY - 2007

Y1 - 2007

N2 - The authors report charge retention in preferentially (117) oriented and textured c -axis oriented ferroelectric Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy. Surface charges of the films were observed as a function of time in a selected area which consists of a single-poled region and a reverse-poled region. The highly (117) oriented film shows the extended exponential decay with characteristic scaling exponents, n=1.5-1.6. The preferentially c -axis oriented film shows a remarkable retained behavior regardless of the poling. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.

AB - The authors report charge retention in preferentially (117) oriented and textured c -axis oriented ferroelectric Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy. Surface charges of the films were observed as a function of time in a selected area which consists of a single-poled region and a reverse-poled region. The highly (117) oriented film shows the extended exponential decay with characteristic scaling exponents, n=1.5-1.6. The preferentially c -axis oriented film shows a remarkable retained behavior regardless of the poling. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.

UR - https://www.scopus.com/pages/publications/33847219277

U2 - 10.1063/1.2472181

DO - 10.1063/1.2472181

M3 - Article

AN - SCOPUS:33847219277

SN - 0003-6951

VL - 90

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 8

M1 - 082901

ER -

Charge retention behavior of preferentially oriented and textured Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy

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