Charge retention behavior of preferentially oriented and textured Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy

T. Y. Kim; J. H. Lee; Y. J. Oh; M. R. Choi; W. Jo

doi:10.1063/1.2472181

Charge retention behavior of preferentially oriented and textured Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy

T. Y. Kim, J. H. Lee, Y. J. Oh, M. R. Choi, W. Jo

Department of Physics

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

The authors report charge retention in preferentially (117) oriented and textured c -axis oriented ferroelectric Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy. Surface charges of the films were observed as a function of time in a selected area which consists of a single-poled region and a reverse-poled region. The highly (117) oriented film shows the extended exponential decay with characteristic scaling exponents, n=1.5-1.6. The preferentially c -axis oriented film shows a remarkable retained behavior regardless of the poling. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.

Original language	English
Article number	082901
Journal	Applied Physics Letters
Volume	90
Issue number	8
DOIs	https://doi.org/10.1063/1.2472181
State	Published - 2007

Bibliographical note

Funding Information:
This work was by a grant (Code No. 06K1501-02520) from “Center for Nanostructured Materials Technology” under “21st Century Frontier R&D Programs” of the Ministry of Science and Technology, Korea.

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title = "Charge retention behavior of preferentially oriented and textured Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy",

abstract = "The authors report charge retention in preferentially (117) oriented and textured c -axis oriented ferroelectric Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy. Surface charges of the films were observed as a function of time in a selected area which consists of a single-poled region and a reverse-poled region. The highly (117) oriented film shows the extended exponential decay with characteristic scaling exponents, n=1.5-1.6. The preferentially c -axis oriented film shows a remarkable retained behavior regardless of the poling. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.",

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T1 - Charge retention behavior of preferentially oriented and textured Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy

AU - Kim, T. Y.

AU - Lee, J. H.

AU - Oh, Y. J.

AU - Choi, M. R.

AU - Jo, W.

N1 - Funding Information: This work was by a grant (Code No. 06K1501-02520) from “Center for Nanostructured Materials Technology” under “21st Century Frontier R&D Programs” of the Ministry of Science and Technology, Korea.

PY - 2007

Y1 - 2007

N2 - The authors report charge retention in preferentially (117) oriented and textured c -axis oriented ferroelectric Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy. Surface charges of the films were observed as a function of time in a selected area which consists of a single-poled region and a reverse-poled region. The highly (117) oriented film shows the extended exponential decay with characteristic scaling exponents, n=1.5-1.6. The preferentially c -axis oriented film shows a remarkable retained behavior regardless of the poling. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.

AB - The authors report charge retention in preferentially (117) oriented and textured c -axis oriented ferroelectric Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy. Surface charges of the films were observed as a function of time in a selected area which consists of a single-poled region and a reverse-poled region. The highly (117) oriented film shows the extended exponential decay with characteristic scaling exponents, n=1.5-1.6. The preferentially c -axis oriented film shows a remarkable retained behavior regardless of the poling. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.

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Charge retention behavior of preferentially oriented and textured Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy

Abstract

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