Charge retention behavior of preferentially oriented and textured Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy

T. Y. Kim, J. H. Lee, Y. J. Oh, M. R. Choi, W. Jo

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Abstract

The authors report charge retention in preferentially (117) oriented and textured c -axis oriented ferroelectric Bi3.25 La0.75 Ti3 O12 thin films by electrostatic force microscopy. Surface charges of the films were observed as a function of time in a selected area which consists of a single-poled region and a reverse-poled region. The highly (117) oriented film shows the extended exponential decay with characteristic scaling exponents, n=1.5-1.6. The preferentially c -axis oriented film shows a remarkable retained behavior regardless of the poling. Decay and retention mechanisms of the regions are explained by space-charge redistribution and trapping of defects in the films.

Original languageEnglish
Article number082901
JournalApplied Physics Letters
Volume90
Issue number8
DOIs
StatePublished - 2007

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