Characterization of Pt/a-plane GaN Schottky contacts using conductive atomic force microscopy

  • Soo Hyon Phark
  • , Hogyoung Kim
  • , Keun Man Song
  • , Phil Geun Kang
  • , Heung Soo Shin
  • , Dong Wook Kim

Research output: Contribution to journalArticlepeer-review

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