Carrier lifetime engineering for floating-body cell memory

Sungho Kim, Sung Jin Choi, Dong Il Moon, Yang Kyu Choi

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

A novel bias scheme is demonstrated for performance improvement of floating-body cell memory, particularly retention time. Its basic mechanism is based on carrier lifetime engineering, which takes advantage of generation lifetime that is longer than recombination lifetime. In addition, the proposed scheme is suitable for low-power operation; a high drain bias is unnecessary to generate excess carriers, which allows reliable endurance of up to 10 12 switching instances at 85 ^̂{C}.

Original languageEnglish
Article number6108357
Pages (from-to)367-373
Number of pages7
JournalIEEE Transactions on Electron Devices
Volume59
Issue number2
DOIs
StatePublished - Feb 2012

Keywords

  • 1T-DRAM
  • Carrier lifetime
  • double gate
  • finFET
  • floating-body cell (FBC)
  • silicon-on-insulator (SOI) metal-oxide-semiconductor field-effect transistor (MOSFET)

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