Bulk damage threshold and three-dimensional microstructuring of dielectrics using the self-focusing of ultrashort laser pulses

D. Ashkenasi; A. Rosenfeld; H. Varel; M. Lorenz; E. E.B. Campbell

doi:10.1109/cleo.1998.675981

Bulk damage threshold and three-dimensional microstructuring of dielectrics using the self-focusing of ultrashort laser pulses

D. Ashkenasi, A. Rosenfeld, H. Varel, M. Lorenz, E. E.B. Campbell

Department of Physics

Research output: Contribution to conference › Paper › peer-review

1 Scopus citations

Abstract

The short-pulse laser-induced bulk damage of dielectrics and the capabilities of nonlinear optical effects to generate controllable bulk microstructure are studied on self-focusing in different wide bandgap materials with picosecond and subpicosecond laser pulses. The experimental result the studies are presented in details.

Original language	English
Pages	149-150
Number of pages	2
DOIs	https://doi.org/10.1109/cleo.1998.675981
State	Published - 1998
Event	Proceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO - San Francisco, CA, USA Duration: 3 May 1998 → 8 May 1998

Conference

Conference	Proceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO
City	San Francisco, CA, USA
Period	3/05/98 → 8/05/98

Access to Document

10.1109/cleo.1998.675981

Cite this

Ashkenasi, D., Rosenfeld, A., Varel, H., Lorenz, M., & Campbell, E. E. B. (1998). Bulk damage threshold and three-dimensional microstructuring of dielectrics using the self-focusing of ultrashort laser pulses. 149-150. Paper presented at Proceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO, San Francisco, CA, USA. https://doi.org/10.1109/cleo.1998.675981

@conference{33ac4c4cbe364102b698261a877c6b0d,

title = "Bulk damage threshold and three-dimensional microstructuring of dielectrics using the self-focusing of ultrashort laser pulses",

abstract = "The short-pulse laser-induced bulk damage of dielectrics and the capabilities of nonlinear optical effects to generate controllable bulk microstructure are studied on self-focusing in different wide bandgap materials with picosecond and subpicosecond laser pulses. The experimental result the studies are presented in details.",

author = "D. Ashkenasi and A. Rosenfeld and H. Varel and M. Lorenz and Campbell, {E. E.B.}",

year = "1998",

doi = "10.1109/cleo.1998.675981",

language = "English",

pages = "149--150",

note = "Proceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO ; Conference date: 03-05-1998 Through 08-05-1998",

}

Ashkenasi, D, Rosenfeld, A, Varel, H, Lorenz, M & Campbell, EEB 1998, 'Bulk damage threshold and three-dimensional microstructuring of dielectrics using the self-focusing of ultrashort laser pulses', Paper presented at Proceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO, San Francisco, CA, USA, 3/05/98 - 8/05/98 pp. 149-150. https://doi.org/10.1109/cleo.1998.675981

Bulk damage threshold and three-dimensional microstructuring of dielectrics using the self-focusing of ultrashort laser pulses. / Ashkenasi, D.; Rosenfeld, A.; Varel, H. et al.
1998. 149-150 Paper presented at Proceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO, San Francisco, CA, USA.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Bulk damage threshold and three-dimensional microstructuring of dielectrics using the self-focusing of ultrashort laser pulses

AU - Ashkenasi, D.

AU - Rosenfeld, A.

AU - Varel, H.

AU - Lorenz, M.

AU - Campbell, E. E.B.

PY - 1998

Y1 - 1998

N2 - The short-pulse laser-induced bulk damage of dielectrics and the capabilities of nonlinear optical effects to generate controllable bulk microstructure are studied on self-focusing in different wide bandgap materials with picosecond and subpicosecond laser pulses. The experimental result the studies are presented in details.

AB - The short-pulse laser-induced bulk damage of dielectrics and the capabilities of nonlinear optical effects to generate controllable bulk microstructure are studied on self-focusing in different wide bandgap materials with picosecond and subpicosecond laser pulses. The experimental result the studies are presented in details.

UR - http://www.scopus.com/inward/record.url?scp=0031627663&partnerID=8YFLogxK

U2 - 10.1109/cleo.1998.675981

DO - 10.1109/cleo.1998.675981

M3 - Paper

AN - SCOPUS:0031627663

SP - 149

EP - 150

T2 - Proceedings of the 1998 Conference on Lasers and Electro-Optics, CLEO

Y2 - 3 May 1998 through 8 May 1998

ER -

Bulk damage threshold and three-dimensional microstructuring of dielectrics using the self-focusing of ultrashort laser pulses

Abstract

Conference

Access to Document

Fingerprint

Cite this