Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy

A. Li Bassi; C. S. Casari; D. Cattaneo; F. Donati; S. Foglio; M. Passoni; C. E. Bottani; P. Biagioni; A. Brambilla; M. Finazzi; F. Ciccacci; L. Duò

doi:10.1063/1.2800810

Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy

A. Li Bassi
, C. S. Casari
, D. Cattaneo
, F. Donati
, S. Foglio
, M. Passoni
, C. E. Bottani
, P. Biagioni
, A. Brambilla
, M. Finazzi
, F. Ciccacci
, L. Duò

Department of Physics

Research output: Contribution to journal › Article › peer-review

37 Scopus citations

Abstract

A simple, reliable method for the preparation of bulk Cr tips for scanning tunneling microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and spin-polarized STM (SP-STM) are investigated. Cr tips show atomic resolution on ordered surfaces. Contrary to what happens with conventional W tips, rest atoms of the Si (111) -7×7 reconstruction can be routinely observed, probably due to a different electronic structure of the tip apex. SP-STM measurements of the Cr(001) surface showing magnetic contrast are reported. Our results reveal that the peculiar properties of these tips can be suited in a number of STM experimental situations.

Original language	English
Article number	173120
Journal	Applied Physics Letters
Volume	91
Issue number	17
DOIs	https://doi.org/10.1063/1.2800810
State	Published - 2007

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title = "Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy",

abstract = "A simple, reliable method for the preparation of bulk Cr tips for scanning tunneling microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and spin-polarized STM (SP-STM) are investigated. Cr tips show atomic resolution on ordered surfaces. Contrary to what happens with conventional W tips, rest atoms of the Si (111) -7×7 reconstruction can be routinely observed, probably due to a different electronic structure of the tip apex. SP-STM measurements of the Cr(001) surface showing magnetic contrast are reported. Our results reveal that the peculiar properties of these tips can be suited in a number of STM experimental situations.",

author = "\{Li Bassi\}, A. and Casari, \{C. S.\} and D. Cattaneo and F. Donati and S. Foglio and M. Passoni and Bottani, \{C. E.\} and P. Biagioni and A. Brambilla and M. Finazzi and F. Ciccacci and L. Du{\`o}",

year = "2007",

doi = "10.1063/1.2800810",

language = "English",

volume = "91",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

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TY - JOUR

T1 - Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy

AU - Li Bassi, A.

AU - Casari, C. S.

AU - Cattaneo, D.

AU - Donati, F.

AU - Foglio, S.

AU - Passoni, M.

AU - Bottani, C. E.

AU - Biagioni, P.

AU - Brambilla, A.

AU - Finazzi, M.

AU - Ciccacci, F.

AU - Duò, L.

PY - 2007

Y1 - 2007

N2 - A simple, reliable method for the preparation of bulk Cr tips for scanning tunneling microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and spin-polarized STM (SP-STM) are investigated. Cr tips show atomic resolution on ordered surfaces. Contrary to what happens with conventional W tips, rest atoms of the Si (111) -7×7 reconstruction can be routinely observed, probably due to a different electronic structure of the tip apex. SP-STM measurements of the Cr(001) surface showing magnetic contrast are reported. Our results reveal that the peculiar properties of these tips can be suited in a number of STM experimental situations.

AB - A simple, reliable method for the preparation of bulk Cr tips for scanning tunneling microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and spin-polarized STM (SP-STM) are investigated. Cr tips show atomic resolution on ordered surfaces. Contrary to what happens with conventional W tips, rest atoms of the Si (111) -7×7 reconstruction can be routinely observed, probably due to a different electronic structure of the tip apex. SP-STM measurements of the Cr(001) surface showing magnetic contrast are reported. Our results reveal that the peculiar properties of these tips can be suited in a number of STM experimental situations.

UR - https://www.scopus.com/pages/publications/35548930248

U2 - 10.1063/1.2800810

DO - 10.1063/1.2800810

M3 - Article

AN - SCOPUS:35548930248

SN - 0003-6951

VL - 91

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 17

M1 - 173120

ER -

Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy

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