Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy

A. Li Bassi; C. S. Casari; D. Cattaneo; F. Donati; S. Foglio; M. Passoni; C. E. Bottani; P. Biagioni; A. Brambilla; M. Finazzi; F. Ciccacci; L. Duò

doi:10.1063/1.2800810

Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy

A. Li Bassi, C. S. Casari, D. Cattaneo, F. Donati, S. Foglio, M. Passoni, C. E. Bottani, P. Biagioni, A. Brambilla, M. Finazzi, F. Ciccacci, L. Duò

Department of Physics

Research output: Contribution to journal › Article › peer-review

36 Scopus citations

Abstract

A simple, reliable method for the preparation of bulk Cr tips for scanning tunneling microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and spin-polarized STM (SP-STM) are investigated. Cr tips show atomic resolution on ordered surfaces. Contrary to what happens with conventional W tips, rest atoms of the Si (111) -7×7 reconstruction can be routinely observed, probably due to a different electronic structure of the tip apex. SP-STM measurements of the Cr(001) surface showing magnetic contrast are reported. Our results reveal that the peculiar properties of these tips can be suited in a number of STM experimental situations.

Original language	English
Article number	173120
Journal	Applied Physics Letters
Volume	91
Issue number	17
DOIs	https://doi.org/10.1063/1.2800810
State	Published - 2007

Access to Document

10.1063/1.2800810

Cite this

@article{9863882e128b417ab0e6f761883e9516,

title = "Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy",

abstract = "A simple, reliable method for the preparation of bulk Cr tips for scanning tunneling microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and spin-polarized STM (SP-STM) are investigated. Cr tips show atomic resolution on ordered surfaces. Contrary to what happens with conventional W tips, rest atoms of the Si (111) -7×7 reconstruction can be routinely observed, probably due to a different electronic structure of the tip apex. SP-STM measurements of the Cr(001) surface showing magnetic contrast are reported. Our results reveal that the peculiar properties of these tips can be suited in a number of STM experimental situations.",

author = "\{Li Bassi\}, A. and Casari, \{C. S.\} and D. Cattaneo and F. Donati and S. Foglio and M. Passoni and Bottani, \{C. E.\} and P. Biagioni and A. Brambilla and M. Finazzi and F. Ciccacci and L. Du{\`o}",

year = "2007",

doi = "10.1063/1.2800810",

language = "English",

volume = "91",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "17",

}

TY - JOUR

T1 - Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy

AU - Li Bassi, A.

AU - Casari, C. S.

AU - Cattaneo, D.

AU - Donati, F.

AU - Foglio, S.

AU - Passoni, M.

AU - Bottani, C. E.

AU - Biagioni, P.

AU - Brambilla, A.

AU - Finazzi, M.

AU - Ciccacci, F.

AU - Duò, L.

PY - 2007

Y1 - 2007

N2 - A simple, reliable method for the preparation of bulk Cr tips for scanning tunneling microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and spin-polarized STM (SP-STM) are investigated. Cr tips show atomic resolution on ordered surfaces. Contrary to what happens with conventional W tips, rest atoms of the Si (111) -7×7 reconstruction can be routinely observed, probably due to a different electronic structure of the tip apex. SP-STM measurements of the Cr(001) surface showing magnetic contrast are reported. Our results reveal that the peculiar properties of these tips can be suited in a number of STM experimental situations.

AB - A simple, reliable method for the preparation of bulk Cr tips for scanning tunneling microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and spin-polarized STM (SP-STM) are investigated. Cr tips show atomic resolution on ordered surfaces. Contrary to what happens with conventional W tips, rest atoms of the Si (111) -7×7 reconstruction can be routinely observed, probably due to a different electronic structure of the tip apex. SP-STM measurements of the Cr(001) surface showing magnetic contrast are reported. Our results reveal that the peculiar properties of these tips can be suited in a number of STM experimental situations.

UR - https://www.scopus.com/pages/publications/35548930248

U2 - 10.1063/1.2800810

DO - 10.1063/1.2800810

M3 - Article

AN - SCOPUS:35548930248

SN - 0003-6951

VL - 91

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 17

M1 - 173120

ER -

Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy

Abstract

Access to Document

Fingerprint

Cite this