Abstract
We have studied GaAs1-xBix (up to x∼3%) using Raman scattering with two different polarization configurations. Two Bi-induced phonon modes are observed at ∼186 cm-1 and ∼214 cm -1 with increasing Raman intensity as the Bi concentration increases. By comparing Raman selection rules for the observed Bi-induced phonon modes with those for the substitutional N vibrational mode (GaN mode) in GaAsN, the phonon mode at ∼214 cm-1 is identified as originating from substitutional Bi at the As site in GaAsBi.
| Original language | English |
|---|---|
| Pages (from-to) | 394-400 |
| Number of pages | 7 |
| Journal | Superlattices and Microstructures |
| Volume | 37 |
| Issue number | 6 |
| DOIs | |
| State | Published - Jun 2005 |
Bibliographical note
Funding Information:This work was supported by the Chung-Ang University Research Grants in 2004.
Keywords
- GaAsBi
- Isoelectronic impurity
- Phonon
- Raman scattering