Skip to main navigation Skip to search Skip to main content

Barrier height measurement of metal contacts to Si nanowires using internal photoemission of hot carriers

  • Kunho Yoon
  • , Jerome K. Hyun
  • , Justin G. Connell
  • , Iddo Amit
  • , Yossi Rosenwaks
  • , Lincoln J. Lauhon

Research output: Contribution to journal › Article › peer-review

28 Scopus citations

Fingerprint

Dive into the research topics of 'Barrier height measurement of metal contacts to Si nanowires using internal photoemission of hot carriers'. Together they form a unique fingerprint.
Sort by

Engineering

Material Science