Applied physics: Looking below the surface

Andreas J. Heinrich

doi:10.1126/science.1170744

Applied physics: Looking below the surface

Andreas J. Heinrich

Department of Physics

Research output: Contribution to journal › Short survey › peer-review

5 Scopus citations

Abstract

Scanning tunneling microscopy can now be used to determine electronic properties of bulk materials.

Original language	English
Pages (from-to)	1178-1179
Number of pages	2
Journal	Science
Volume	323
Issue number	5918
DOIs	https://doi.org/10.1126/science.1170744
State	Published - 27 Feb 2009

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title = "Applied physics: Looking below the surface",

abstract = "Scanning tunneling microscopy can now be used to determine electronic properties of bulk materials.",

author = "Heinrich, \{Andreas J.\}",

year = "2009",

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journal = "Science",

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T1 - Applied physics

T2 - Looking below the surface

AU - Heinrich, Andreas J.

PY - 2009/2/27

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N2 - Scanning tunneling microscopy can now be used to determine electronic properties of bulk materials.

AB - Scanning tunneling microscopy can now be used to determine electronic properties of bulk materials.

UR - https://www.scopus.com/pages/publications/61349196233

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DO - 10.1126/science.1170744

M3 - Short survey

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SN - 0036-8075

VL - 323

SP - 1178

EP - 1179

JO - Science

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Applied physics: Looking below the surface

Abstract

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