Applied physics: Looking below the surface

Andreas J. Heinrich

doi:10.1126/science.1170744

Applied physics: Looking below the surface

Andreas J. Heinrich

Department of Physics

Research output: Contribution to journal › Short survey › peer-review

5 Scopus citations

Abstract

Scanning tunneling microscopy can now be used to determine electronic properties of bulk materials.

Original language	English
Pages (from-to)	1178-1179
Number of pages	2
Journal	Science
Volume	323
Issue number	5918
DOIs	https://doi.org/10.1126/science.1170744
State	Published - 27 Feb 2009

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title = "Applied physics: Looking below the surface",

abstract = "Scanning tunneling microscopy can now be used to determine electronic properties of bulk materials.",

author = "Heinrich, {Andreas J.}",

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Applied physics: Looking below the surface

Abstract

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