TY - GEN
T1 - Anomalous temperature dependence of NMOSFET lifetime under hot electron stress
AU - Hwang, Hyunsang
AU - Goo, Jung Suk
AU - Kwon, Hoyup
AU - Shin, Hyungsoon
N1 - Publisher Copyright:
© 1994 Editions Frontieres.
PY - 1994
Y1 - 1994
N2 - In this paper, an anomalous temperature dependence of hot carrier lifetime has been extensively studied for the first time. We have found that the hot carrier lifetime does not increase linearly with increasing stress temperature. On the contrary, around 90°C, hot carrier lifetime decreases with increasing stress temperature. Using the charge pumping method, we found that interface state distribution after hot carrier stress at high temperature is less localized. Since interface state on channel region is more effective than that on LDD region, lower lifetime at high temperature can be explained. This anomalous behavior causes significant impact on device reliability while operating at high temperature.
AB - In this paper, an anomalous temperature dependence of hot carrier lifetime has been extensively studied for the first time. We have found that the hot carrier lifetime does not increase linearly with increasing stress temperature. On the contrary, around 90°C, hot carrier lifetime decreases with increasing stress temperature. Using the charge pumping method, we found that interface state distribution after hot carrier stress at high temperature is less localized. Since interface state on channel region is more effective than that on LDD region, lower lifetime at high temperature can be explained. This anomalous behavior causes significant impact on device reliability while operating at high temperature.
UR - http://www.scopus.com/inward/record.url?scp=84907699038&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84907699038
T3 - European Solid-State Device Research Conference
SP - 381
EP - 384
BT - European Solid-State Device Research Conference
A2 - Ashburn, Peter
A2 - Hill, Chris
PB - IEEE Computer Society
T2 - 24th European Solid State Device Research Conference, ESSDERC 1994
Y2 - 11 September 1994 through 15 September 1994
ER -