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Anomalous effect of trench-oxide depth on alpha-particle-induced charge collection
Hyungsoon Shin
, Nak Myeong Kim
Electronic and Electrical Engineering
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Dive into the research topics of 'Anomalous effect of trench-oxide depth on alpha-particle-induced charge collection'. Together they form a unique fingerprint.
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Engineering
Alpha Particle
100%
Error Rate
50%
Induced Charge
100%
Simulation Result
50%
Immunology and Microbiology
Alpha Radiation
100%
Cell Isolation
50%
Physics
Alpha Radiation
100%