Analysis of the accuracy of the local thermal noise sources for the impedance field method using the Monte Carlo method

Sung Joon Hong; Hyunchul Nah; Young June Park; Hong Shick Min; Chanho Lee; Hyungsoon Shin

Analysis of the accuracy of the local thermal noise sources for the impedance field method using the Monte Carlo method

Sung Joon Hong, Hyunchul Nah, Young June Park, Hong Shick Min, Chanho Lee, Hyungsoon Shin

Electronic and Electrical Engineering

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

We show that the local thermal noise sources for the impedance field method (IFM) can be calculated accurately using the Monte Carlo method (MC). Using the results from MC method, we investigate the accuracy of the conventional thermal noise sources used to calculate the noise with the IFM. The results for a 0.1 μm N⁺-N-N⁺ device show that the conventional local thermal noise sources can be wrong for submicron devices. We also present the method of terminal noise calculation using an impedance field which is suitable for the Monte Carlo method. This method is compared with the conventional method which uses the autocorrelation function in Monte Carlo method. The results show that the method using the impedance field is very stable and fast numerically.

Original language	English
Pages (from-to)	77-81
Number of pages	5
Journal	Journal of the Korean Physical Society
Volume	40
Issue number	1
State	Published - Jan 2002

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@article{79488fbf67f148068ae1680f0f3bdba7,

title = "Analysis of the accuracy of the local thermal noise sources for the impedance field method using the Monte Carlo method",

abstract = "We show that the local thermal noise sources for the impedance field method (IFM) can be calculated accurately using the Monte Carlo method (MC). Using the results from MC method, we investigate the accuracy of the conventional thermal noise sources used to calculate the noise with the IFM. The results for a 0.1 μm N+-N-N+ device show that the conventional local thermal noise sources can be wrong for submicron devices. We also present the method of terminal noise calculation using an impedance field which is suitable for the Monte Carlo method. This method is compared with the conventional method which uses the autocorrelation function in Monte Carlo method. The results show that the method using the impedance field is very stable and fast numerically.",

author = "Hong, {Sung Joon} and Hyunchul Nah and Park, {Young June} and Min, {Hong Shick} and Chanho Lee and Hyungsoon Shin",

year = "2002",

month = jan,

language = "English",

volume = "40",

pages = "77--81",

journal = "Journal of the Korean Physical Society",

issn = "0374-4884",

publisher = "Korean Physical Society",

number = "1",

}

TY - JOUR

T1 - Analysis of the accuracy of the local thermal noise sources for the impedance field method using the Monte Carlo method

AU - Hong, Sung Joon

AU - Nah, Hyunchul

AU - Park, Young June

AU - Min, Hong Shick

AU - Lee, Chanho

AU - Shin, Hyungsoon

PY - 2002/1

Y1 - 2002/1

N2 - We show that the local thermal noise sources for the impedance field method (IFM) can be calculated accurately using the Monte Carlo method (MC). Using the results from MC method, we investigate the accuracy of the conventional thermal noise sources used to calculate the noise with the IFM. The results for a 0.1 μm N+-N-N+ device show that the conventional local thermal noise sources can be wrong for submicron devices. We also present the method of terminal noise calculation using an impedance field which is suitable for the Monte Carlo method. This method is compared with the conventional method which uses the autocorrelation function in Monte Carlo method. The results show that the method using the impedance field is very stable and fast numerically.

AB - We show that the local thermal noise sources for the impedance field method (IFM) can be calculated accurately using the Monte Carlo method (MC). Using the results from MC method, we investigate the accuracy of the conventional thermal noise sources used to calculate the noise with the IFM. The results for a 0.1 μm N+-N-N+ device show that the conventional local thermal noise sources can be wrong for submicron devices. We also present the method of terminal noise calculation using an impedance field which is suitable for the Monte Carlo method. This method is compared with the conventional method which uses the autocorrelation function in Monte Carlo method. The results show that the method using the impedance field is very stable and fast numerically.

UR - http://www.scopus.com/inward/record.url?scp=0036002401&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0036002401

SN - 0374-4884

VL - 40

SP - 77

EP - 81

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

IS - 1

ER -

Analysis of the accuracy of the local thermal noise sources for the impedance field method using the Monte Carlo method

Abstract

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