An optimized test sequence satisfying the completeness criteria

Hongse Son, Daehun Nyang, Sangyong Lim, Jinho Park, Young Han Choe, Byungmun Chin, Jooseok Song

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we show that the length of the test sequence satisfying the completeness can be reduced. Finally, we illustrate our technique on a specific example.

Original languageEnglish
Title of host publicationProceedings - 12th International Conference on Information Networking, ICOIN 1998
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages621-625
Number of pages5
ISBN (Electronic)0818672250, 9780818672255
DOIs
StatePublished - 1998
Event12th International Conference on Information Networking, ICOIN 1998 - Koganei, Tokyo, Japan
Duration: 21 Jan 199823 Jan 1998

Publication series

NameProceedings - 12th International Conference on Information Networking, ICOIN 1998

Conference

Conference12th International Conference on Information Networking, ICOIN 1998
Country/TerritoryJapan
CityKoganei, Tokyo
Period21/01/9823/01/98

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