TY - GEN
T1 - An optimized test sequence satisfying the completeness criteria
AU - Son, Hongse
AU - Nyang, Daehun
AU - Lim, Sangyong
AU - Park, Jinho
AU - Choe, Young Han
AU - Chin, Byungmun
AU - Song, Jooseok
N1 - Publisher Copyright:
© 1998 IEEE.
PY - 1998
Y1 - 1998
N2 - We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we show that the length of the test sequence satisfying the completeness can be reduced. Finally, we illustrate our technique on a specific example.
AB - We present a problem of commonly used characterization sequences and propose a new test sequence to resolve the problem. The proposed test sequence could decide whether the output fault arises in the edge being tested or one of edges in the UIO sequence. Additionally, the fault coverage is much wider than other test sequence generation methods. To achieve the goal, we introduce k-strong FSM, and show that it can be constructed from a characterization sequence. Also, we show that the length of the test sequence satisfying the completeness can be reduced. Finally, we illustrate our technique on a specific example.
UR - http://www.scopus.com/inward/record.url?scp=33646249492&partnerID=8YFLogxK
U2 - 10.1109/ICOIN.1998.648477
DO - 10.1109/ICOIN.1998.648477
M3 - Conference contribution
AN - SCOPUS:33646249492
T3 - Proceedings - 12th International Conference on Information Networking, ICOIN 1998
SP - 621
EP - 625
BT - Proceedings - 12th International Conference on Information Networking, ICOIN 1998
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 21 January 1998 through 23 January 1998
ER -