AFM image visualization of layered dichalcogenides, 1T-MTe2(M = V, Ta)

Sung Jin Kim, So Jung Park, Il Cheol Jeon, Changhong Kim, Chonghong Pyun, Kyeong Ae Yee

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

The surface structures of the layered chalcogenide VTe2, TaTe2 were probed by atomic force microscopy (AFM). The observed AFM images at the atomic level were analyzed by calculating the total electron density maps. The title compounds adopt double zigzag CDWs (Charge Density Waves) resulting in three unique tellurides. Thus, the brightness of the AFM image on the corrugated surface decreases in the order of Te(3) > Te(1) ≫ Te(2), Also, metal in the VTe2 system is more localized than that of TaTe2.

Original languageEnglish
Pages (from-to)659-663
Number of pages5
JournalJournal of Physics and Chemistry of Solids
Volume58
Issue number4
DOIs
StatePublished - Apr 1997

Keywords

  • A.ditelluride
  • C. AFM
  • D. CDW
  • D. clustering
  • D. electronic structure

Fingerprint

Dive into the research topics of 'AFM image visualization of layered dichalcogenides, 1T-MTe2(M = V, Ta)'. Together they form a unique fingerprint.

Cite this