A circuit-level model of a magnetic tunnel junction (MTJ) that accurately depicts the spin-transfer torque switching behavior of an MTJ along with its voltage/temperature dependency is presented. The unified switching model that was suggested in our previous work is suitable for the circuit-level model because the model seamlessly covers the entire current pulsewidth region. Based on this switching behavior model, a method of dynamic current monitoring is proposed for an advanced circuit-level model. The voltage/temperature characteristics of an MTJ are also integrated for a more accurate circuit-level simulation. The proposed model corresponds well with the experimental data for switching characteristics at different temperatures. The design margin in the read/write circuits with an MTJ is analyzed to demonstrate the effectiveness of the model.
- Magnetic tunnel junction (MTJ)
- magnetoresistive random access memory (MRAM)
- spin-transfer torque (STT)
- tunneling magnetoresistance (TMR)